Challenges in the development of a reliable cw-LIDT measurement routine

Research output: Contribution to journalArticleResearchpeer review

Authors

  • Kevin Kiedrowski
  • Marco Jupé
  • Henrik Ehlers
  • Michael Kennedy
  • Andreas Wienke
  • Detlev Ristau

External Research Organisations

  • Laser Zentrum Hannover e.V. (LZH)
  • Laseroptik GmbH
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Details

Original languageEnglish
Pages (from-to)1712-1725
Number of pages14
JournalOptical materials express
Volume13
Issue number6
Publication statusPublished - 22 May 2023

Abstract

The characterization of continuous-wave (cw) laser-induced damage threshold (LIDT) requires a suitable measurement routine to obtain reliable results. In this study, we show that the existing measurement protocols are of limited use for cw-LIDT measurements. On the basis of testing several mirrors with varied distance and number of spots on the samples an adapted protocol for the damage behavior under cw laser irradiation is proposed. We observed a significant effect governed by debris and induced stress of induced damages on the damage behavior of subsequent irradiation spots. Finally, we performed a parametric study on the optical properties of mirror designs consisting of a metal and a dielectric multilayer film and demonstrated the LIDT dependence on the thermal conductivity of the substrate and the absorption of the components.

ASJC Scopus subject areas

Cite this

Challenges in the development of a reliable cw-LIDT measurement routine. / Kiedrowski, Kevin; Jupé, Marco; Ehlers, Henrik et al.
In: Optical materials express, Vol. 13, No. 6, 22.05.2023, p. 1712-1725.

Research output: Contribution to journalArticleResearchpeer review

Kiedrowski, K, Jupé, M, Ehlers, H, Kennedy, M, Wienke, A & Ristau, D 2023, 'Challenges in the development of a reliable cw-LIDT measurement routine', Optical materials express, vol. 13, no. 6, pp. 1712-1725. https://doi.org/10.1364/OME.488629
Kiedrowski, K., Jupé, M., Ehlers, H., Kennedy, M., Wienke, A., & Ristau, D. (2023). Challenges in the development of a reliable cw-LIDT measurement routine. Optical materials express, 13(6), 1712-1725. https://doi.org/10.1364/OME.488629
Kiedrowski K, Jupé M, Ehlers H, Kennedy M, Wienke A, Ristau D. Challenges in the development of a reliable cw-LIDT measurement routine. Optical materials express. 2023 May 22;13(6):1712-1725. doi: 10.1364/OME.488629
Kiedrowski, Kevin ; Jupé, Marco ; Ehlers, Henrik et al. / Challenges in the development of a reliable cw-LIDT measurement routine. In: Optical materials express. 2023 ; Vol. 13, No. 6. pp. 1712-1725.
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@article{8a5277aa6b5e42b5b726a5bcd4ae1746,
title = "Challenges in the development of a reliable cw-LIDT measurement routine",
abstract = "The characterization of continuous-wave (cw) laser-induced damage threshold (LIDT) requires a suitable measurement routine to obtain reliable results. In this study, we show that the existing measurement protocols are of limited use for cw-LIDT measurements. On the basis of testing several mirrors with varied distance and number of spots on the samples an adapted protocol for the damage behavior under cw laser irradiation is proposed. We observed a significant effect governed by debris and induced stress of induced damages on the damage behavior of subsequent irradiation spots. Finally, we performed a parametric study on the optical properties of mirror designs consisting of a metal and a dielectric multilayer film and demonstrated the LIDT dependence on the thermal conductivity of the substrate and the absorption of the components.",
author = "Kevin Kiedrowski and Marco Jup{\'e} and Henrik Ehlers and Michael Kennedy and Andreas Wienke and Detlev Ristau",
year = "2023",
month = may,
day = "22",
doi = "10.1364/OME.488629",
language = "English",
volume = "13",
pages = "1712--1725",
journal = "Optical materials express",
issn = "2159-3930",
publisher = "OSA - The Optical Society",
number = "6",

}

Download

TY - JOUR

T1 - Challenges in the development of a reliable cw-LIDT measurement routine

AU - Kiedrowski, Kevin

AU - Jupé, Marco

AU - Ehlers, Henrik

AU - Kennedy, Michael

AU - Wienke, Andreas

AU - Ristau, Detlev

PY - 2023/5/22

Y1 - 2023/5/22

N2 - The characterization of continuous-wave (cw) laser-induced damage threshold (LIDT) requires a suitable measurement routine to obtain reliable results. In this study, we show that the existing measurement protocols are of limited use for cw-LIDT measurements. On the basis of testing several mirrors with varied distance and number of spots on the samples an adapted protocol for the damage behavior under cw laser irradiation is proposed. We observed a significant effect governed by debris and induced stress of induced damages on the damage behavior of subsequent irradiation spots. Finally, we performed a parametric study on the optical properties of mirror designs consisting of a metal and a dielectric multilayer film and demonstrated the LIDT dependence on the thermal conductivity of the substrate and the absorption of the components.

AB - The characterization of continuous-wave (cw) laser-induced damage threshold (LIDT) requires a suitable measurement routine to obtain reliable results. In this study, we show that the existing measurement protocols are of limited use for cw-LIDT measurements. On the basis of testing several mirrors with varied distance and number of spots on the samples an adapted protocol for the damage behavior under cw laser irradiation is proposed. We observed a significant effect governed by debris and induced stress of induced damages on the damage behavior of subsequent irradiation spots. Finally, we performed a parametric study on the optical properties of mirror designs consisting of a metal and a dielectric multilayer film and demonstrated the LIDT dependence on the thermal conductivity of the substrate and the absorption of the components.

UR - http://www.scopus.com/inward/record.url?scp=85162255953&partnerID=8YFLogxK

U2 - 10.1364/OME.488629

DO - 10.1364/OME.488629

M3 - Article

AN - SCOPUS:85162255953

VL - 13

SP - 1712

EP - 1725

JO - Optical materials express

JF - Optical materials express

SN - 2159-3930

IS - 6

ER -