Calibration of Electric Probes for Post-Processing of Near-Field Scanning Data

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Authors

  • Adam Tankielun
  • Heyno Garbe
  • Werner John

External Research Organisations

  • Paderborn University
  • Fraunhofer Institute for Reliability and Microintegration (IZM)
View graph of relations

Details

Original languageEnglish
Title of host publication2006 IEEE International Symposium on Electromagnetic Compatibility
Subtitle of host publicationEMC
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages119-124
Number of pages6
ISBN (print)142440293X, 9781424402939
Publication statusPublished - 2006
Event2006 IEEE International Symposium on Electromagnetic Compatibility, EMC 2006 - Portland, United States
Duration: 14 Aug 200618 Aug 2006

Publication series

NameIEEE International Symposium on Electromagnetic Compatibility
Volume1
ISSN (Print)1077-4076

Abstract

In order to compensate nonideal receiving characteristic of electric probes used in planar electromagnetic near-field scanning, scalar calibration and post-processing method based on deconvolution is proposed. The measurement setup and numerical procedure for discrete data processing is described in detail. The receiving characteristics of the probes are directly determined from scanning measurements and fullwave simulation of the specific calibration structure. Special attention is given to reduction of post-processing errors due to noisy input data. The compensation procedure is successfully validated with two probes and two planar test objects over two decades of frequency. The deconvolution method greatly improves spatial resolution of near-field scans and accurately determines distribution of normal electric field in true levels.

Keywords

    Calibration, Compensation, Deconvolution, Near-field scanning, Nearfield probes, Resolution enhancement

ASJC Scopus subject areas

Cite this

Calibration of Electric Probes for Post-Processing of Near-Field Scanning Data. / Tankielun, Adam; Garbe, Heyno; John, Werner.
2006 IEEE International Symposium on Electromagnetic Compatibility: EMC. Institute of Electrical and Electronics Engineers Inc., 2006. p. 119-124 1706276 (IEEE International Symposium on Electromagnetic Compatibility; Vol. 1).

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Tankielun, A, Garbe, H & John, W 2006, Calibration of Electric Probes for Post-Processing of Near-Field Scanning Data. in 2006 IEEE International Symposium on Electromagnetic Compatibility: EMC., 1706276, IEEE International Symposium on Electromagnetic Compatibility, vol. 1, Institute of Electrical and Electronics Engineers Inc., pp. 119-124, 2006 IEEE International Symposium on Electromagnetic Compatibility, EMC 2006, Portland, Oregon, United States, 14 Aug 2006. https://doi.org/10.1109/isemc.2006.1706276
Tankielun, A., Garbe, H., & John, W. (2006). Calibration of Electric Probes for Post-Processing of Near-Field Scanning Data. In 2006 IEEE International Symposium on Electromagnetic Compatibility: EMC (pp. 119-124). Article 1706276 (IEEE International Symposium on Electromagnetic Compatibility; Vol. 1). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/isemc.2006.1706276
Tankielun A, Garbe H, John W. Calibration of Electric Probes for Post-Processing of Near-Field Scanning Data. In 2006 IEEE International Symposium on Electromagnetic Compatibility: EMC. Institute of Electrical and Electronics Engineers Inc. 2006. p. 119-124. 1706276. (IEEE International Symposium on Electromagnetic Compatibility). doi: 10.1109/isemc.2006.1706276
Tankielun, Adam ; Garbe, Heyno ; John, Werner. / Calibration of Electric Probes for Post-Processing of Near-Field Scanning Data. 2006 IEEE International Symposium on Electromagnetic Compatibility: EMC. Institute of Electrical and Electronics Engineers Inc., 2006. pp. 119-124 (IEEE International Symposium on Electromagnetic Compatibility).
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