Building Blocks for Industrial, Screen-Printed Double-Side Contacted POLO Cells with Highly Transparent ZnO:Al Layers

Research output: Contribution to journalArticleResearchpeer review

Authors

  • Robby Peibst
  • Yevgeniya Larionova
  • Sina Reiter
  • Tobias F. Wietler
  • Niklas Orlowski
  • Sören Schäfer
  • Byungsul Min
  • Manuel Stratmann
  • Dominic Tetzlaff
  • Jan Krügener
  • Uwe Hohne
  • Jan Dirk Kahler
  • Heiko Mehlich
  • Steffen Frigge
  • Rolf Brendel

External Research Organisations

  • Institute for Solar Energy Research (ISFH)
  • Technische Universität Braunschweig
  • Centrotherm International AG
  • Meyer Burger (Germany) AG
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Details

Original languageEnglish
Pages (from-to)719-725
Number of pages7
JournalIEEE journal of photovoltaics
Volume8
Issue number3
Early online date4 Apr 2018
Publication statusPublished - May 2018

Abstract

We report on an industrial large area, screen-printed, double-side contacted cell with polysilicon on oxide (POLO) junctions on both sides and an energy conversion efficiency of 22.3% (A = 244.15 cm2, Voc = 714 mV, FF = 81.1%, Jsc = 38.5 mA/cm2, measured in-house). This cell shows an extraordinarily low series resistance below 0.05 cm2. This confirms the low specific junction resistance observed recently for POLO junctions. The present cell suffers from 1) low short-circuit current due to parasitic absorption in the rather thick poly-Si (30 nm), as well as in the indium tin oxide, 2) deterioration of the recombination behavior upon sputter deposition of a transparent conductive oxide (TCO), and 3) shunts near the edge due to nonadapted TCO edge exclusion. We address all of these limitations experimentally. In particular, we developed a plasma-enhanced chemical vapor deposition process for ZnO:Al, which does not compromise the passivation of the POLO junctions underneath. An estimation of the efficiency potential (based on the two-diode model and the assumption that all these building blocks can be successfully combined on a cell level) shows that 25.3% can be achieved with this cell concept. We also look into potential cost advantages of the POLO junction scheme for this cell structure, such as the usage of p-type Cz-Si material and the omission of Ag fingers.

Keywords

    Carrier selective contacts, passivation, polycrystalline silicon, silicon solar cell, transparent conductive oxide, zinc oxide

ASJC Scopus subject areas

Cite this

Building Blocks for Industrial, Screen-Printed Double-Side Contacted POLO Cells with Highly Transparent ZnO:Al Layers. / Peibst, Robby; Larionova, Yevgeniya; Reiter, Sina et al.
In: IEEE journal of photovoltaics, Vol. 8, No. 3, 05.2018, p. 719-725.

Research output: Contribution to journalArticleResearchpeer review

Peibst, R, Larionova, Y, Reiter, S, Wietler, TF, Orlowski, N, Schäfer, S, Min, B, Stratmann, M, Tetzlaff, D, Krügener, J, Hohne, U, Kahler, JD, Mehlich, H, Frigge, S & Brendel, R 2018, 'Building Blocks for Industrial, Screen-Printed Double-Side Contacted POLO Cells with Highly Transparent ZnO:Al Layers', IEEE journal of photovoltaics, vol. 8, no. 3, pp. 719-725. https://doi.org/10.1109/jphotov.2018.2813427
Peibst, R., Larionova, Y., Reiter, S., Wietler, T. F., Orlowski, N., Schäfer, S., Min, B., Stratmann, M., Tetzlaff, D., Krügener, J., Hohne, U., Kahler, J. D., Mehlich, H., Frigge, S., & Brendel, R. (2018). Building Blocks for Industrial, Screen-Printed Double-Side Contacted POLO Cells with Highly Transparent ZnO:Al Layers. IEEE journal of photovoltaics, 8(3), 719-725. https://doi.org/10.1109/jphotov.2018.2813427
Peibst R, Larionova Y, Reiter S, Wietler TF, Orlowski N, Schäfer S et al. Building Blocks for Industrial, Screen-Printed Double-Side Contacted POLO Cells with Highly Transparent ZnO:Al Layers. IEEE journal of photovoltaics. 2018 May;8(3):719-725. Epub 2018 Apr 4. doi: 10.1109/jphotov.2018.2813427
Peibst, Robby ; Larionova, Yevgeniya ; Reiter, Sina et al. / Building Blocks for Industrial, Screen-Printed Double-Side Contacted POLO Cells with Highly Transparent ZnO:Al Layers. In: IEEE journal of photovoltaics. 2018 ; Vol. 8, No. 3. pp. 719-725.
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title = "Building Blocks for Industrial, Screen-Printed Double-Side Contacted POLO Cells with Highly Transparent ZnO:Al Layers",
abstract = "We report on an industrial large area, screen-printed, double-side contacted cell with polysilicon on oxide (POLO) junctions on both sides and an energy conversion efficiency of 22.3% (A = 244.15 cm2, Voc = 714 mV, FF = 81.1%, Jsc = 38.5 mA/cm2, measured in-house). This cell shows an extraordinarily low series resistance below 0.05 cm2. This confirms the low specific junction resistance observed recently for POLO junctions. The present cell suffers from 1) low short-circuit current due to parasitic absorption in the rather thick poly-Si (30 nm), as well as in the indium tin oxide, 2) deterioration of the recombination behavior upon sputter deposition of a transparent conductive oxide (TCO), and 3) shunts near the edge due to nonadapted TCO edge exclusion. We address all of these limitations experimentally. In particular, we developed a plasma-enhanced chemical vapor deposition process for ZnO:Al, which does not compromise the passivation of the POLO junctions underneath. An estimation of the efficiency potential (based on the two-diode model and the assumption that all these building blocks can be successfully combined on a cell level) shows that 25.3% can be achieved with this cell concept. We also look into potential cost advantages of the POLO junction scheme for this cell structure, such as the usage of p-type Cz-Si material and the omission of Ag fingers.",
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T1 - Building Blocks for Industrial, Screen-Printed Double-Side Contacted POLO Cells with Highly Transparent ZnO:Al Layers

AU - Peibst, Robby

AU - Larionova, Yevgeniya

AU - Reiter, Sina

AU - Wietler, Tobias F.

AU - Orlowski, Niklas

AU - Schäfer, Sören

AU - Min, Byungsul

AU - Stratmann, Manuel

AU - Tetzlaff, Dominic

AU - Krügener, Jan

AU - Hohne, Uwe

AU - Kahler, Jan Dirk

AU - Mehlich, Heiko

AU - Frigge, Steffen

AU - Brendel, Rolf

N1 - © 2018 IEEE.

PY - 2018/5

Y1 - 2018/5

N2 - We report on an industrial large area, screen-printed, double-side contacted cell with polysilicon on oxide (POLO) junctions on both sides and an energy conversion efficiency of 22.3% (A = 244.15 cm2, Voc = 714 mV, FF = 81.1%, Jsc = 38.5 mA/cm2, measured in-house). This cell shows an extraordinarily low series resistance below 0.05 cm2. This confirms the low specific junction resistance observed recently for POLO junctions. The present cell suffers from 1) low short-circuit current due to parasitic absorption in the rather thick poly-Si (30 nm), as well as in the indium tin oxide, 2) deterioration of the recombination behavior upon sputter deposition of a transparent conductive oxide (TCO), and 3) shunts near the edge due to nonadapted TCO edge exclusion. We address all of these limitations experimentally. In particular, we developed a plasma-enhanced chemical vapor deposition process for ZnO:Al, which does not compromise the passivation of the POLO junctions underneath. An estimation of the efficiency potential (based on the two-diode model and the assumption that all these building blocks can be successfully combined on a cell level) shows that 25.3% can be achieved with this cell concept. We also look into potential cost advantages of the POLO junction scheme for this cell structure, such as the usage of p-type Cz-Si material and the omission of Ag fingers.

AB - We report on an industrial large area, screen-printed, double-side contacted cell with polysilicon on oxide (POLO) junctions on both sides and an energy conversion efficiency of 22.3% (A = 244.15 cm2, Voc = 714 mV, FF = 81.1%, Jsc = 38.5 mA/cm2, measured in-house). This cell shows an extraordinarily low series resistance below 0.05 cm2. This confirms the low specific junction resistance observed recently for POLO junctions. The present cell suffers from 1) low short-circuit current due to parasitic absorption in the rather thick poly-Si (30 nm), as well as in the indium tin oxide, 2) deterioration of the recombination behavior upon sputter deposition of a transparent conductive oxide (TCO), and 3) shunts near the edge due to nonadapted TCO edge exclusion. We address all of these limitations experimentally. In particular, we developed a plasma-enhanced chemical vapor deposition process for ZnO:Al, which does not compromise the passivation of the POLO junctions underneath. An estimation of the efficiency potential (based on the two-diode model and the assumption that all these building blocks can be successfully combined on a cell level) shows that 25.3% can be achieved with this cell concept. We also look into potential cost advantages of the POLO junction scheme for this cell structure, such as the usage of p-type Cz-Si material and the omission of Ag fingers.

KW - Carrier selective contacts

KW - passivation

KW - polycrystalline silicon

KW - silicon solar cell

KW - transparent conductive oxide

KW - zinc oxide

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DO - 10.1109/jphotov.2018.2813427

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VL - 8

SP - 719

EP - 725

JO - IEEE journal of photovoltaics

JF - IEEE journal of photovoltaics

SN - 2156-3381

IS - 3

ER -

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