Details
| Original language | English |
|---|---|
| Pages (from-to) | 7-10 |
| Number of pages | 4 |
| Journal | Advances in Radio Science |
| Volume | 4 |
| Publication status | Published - 4 Sept 2006 |
Abstract
The breakdown behavior of electronics exposed to single transient electromagnetic pulses is subject of investigations for several years. State-of-the-art pulse generators additionally provide the possibility to generate pulse sequences with variable pulse repetition rate. In this article the influence of this repetition rate variation on the breakdown behavior of electronic systems is described. For this purpose microcontroller systems are examined during line-led exposure to pulses with repetition rates between 1 KHz and 100 KHz. Special attention is given to breakdown thresholds and breakdown probabilities of the electronic devices.
ASJC Scopus subject areas
- Engineering(all)
- Electrical and Electronic Engineering
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In: Advances in Radio Science, Vol. 4, 04.09.2006, p. 7-10.
Research output: Contribution to journal › Article › Research › peer review
}
TY - JOUR
T1 - Breakdown behavior of electronics at variable pulse repetition rates
AU - Korte, S.
AU - Garbe, H.
PY - 2006/9/4
Y1 - 2006/9/4
N2 - The breakdown behavior of electronics exposed to single transient electromagnetic pulses is subject of investigations for several years. State-of-the-art pulse generators additionally provide the possibility to generate pulse sequences with variable pulse repetition rate. In this article the influence of this repetition rate variation on the breakdown behavior of electronic systems is described. For this purpose microcontroller systems are examined during line-led exposure to pulses with repetition rates between 1 KHz and 100 KHz. Special attention is given to breakdown thresholds and breakdown probabilities of the electronic devices.
AB - The breakdown behavior of electronics exposed to single transient electromagnetic pulses is subject of investigations for several years. State-of-the-art pulse generators additionally provide the possibility to generate pulse sequences with variable pulse repetition rate. In this article the influence of this repetition rate variation on the breakdown behavior of electronic systems is described. For this purpose microcontroller systems are examined during line-led exposure to pulses with repetition rates between 1 KHz and 100 KHz. Special attention is given to breakdown thresholds and breakdown probabilities of the electronic devices.
UR - http://www.scopus.com/inward/record.url?scp=33748439915&partnerID=8YFLogxK
U2 - 10.5194/ars-4-7-2006
DO - 10.5194/ars-4-7-2006
M3 - Article
AN - SCOPUS:33748439915
VL - 4
SP - 7
EP - 10
JO - Advances in Radio Science
JF - Advances in Radio Science
SN - 1684-9965
ER -