Details
| Original language | English |
|---|---|
| Title of host publication | IEEE-NANO 2015 - 15th International Conference on Nanotechnology |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 1222-1225 |
| Number of pages | 4 |
| ISBN (electronic) | 9781467381550 |
| Publication status | Published - 2015 |
| Externally published | Yes |
| Event | 15th IEEE International Conference on Nanotechnology, IEEE-NANO 2015 - Rome, Italy Duration: 27 Jul 2015 → 30 Jul 2015 |
Publication series
| Name | IEEE-NANO 2015 - 15th International Conference on Nanotechnology |
|---|
Abstract
In dynamic scanning force microscopy (dSFM) an oscillating micromechanical cantilever equipped with an interaction tip is used to provide sub-nanometer spatial resolution data on force gradient related properties of the tip-sample interaction. Our bidirectional dSFM probes provide lateral as well as perpendicular force gradient sensitivity with in-situ-switching capability between the operation directions by employing a special geometry and the first two flexural modes of the cantilever. These probes rely only on basic vertical excitation and detection schemes and are therefore compatible with standard dSFM equipment. A way to increase the sensitivity of the lateral mode is given by a co-resonant detection concept. In the framework of this concept the ease of detection of a micromechanical oscillator, in our case a microstructured cantilever, is combined with the high force gradient sensitivity of a nanomechanical low-stiffness and low-mass carbon nanotube oscillator. The resonance frequency of the nanotube is adjusted via mass deposition to be close to the lateral sensitivity resonance frequency of the cantilever. This ensures that the oscillatory state of the coupled cantilevernanotube system has an increased sensitivity to force gradients but still retains the easy detection of the oscillation of the cantilever. The amplified sensitivity is experimentally verified by comparing data on magnetic measurements acquired with such a co-resonant sensor with calculations for a standard bidirectional sensor.
Keywords
- Carbon Nanotubes, Micro-to-nano-scale bridging, NEMS, Scanning Force Microscopy Probes
ASJC Scopus subject areas
- Chemical Engineering(all)
- Process Chemistry and Technology
- Engineering(all)
- Electrical and Electronic Engineering
- Materials Science(all)
- Ceramics and Composites
- Materials Science(all)
- Electronic, Optical and Magnetic Materials
- Materials Science(all)
- Surfaces, Coatings and Films
Cite this
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IEEE-NANO 2015 - 15th International Conference on Nanotechnology. Institute of Electrical and Electronics Engineers Inc., 2015. p. 1222-1225 7388849 (IEEE-NANO 2015 - 15th International Conference on Nanotechnology).
Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
}
TY - GEN
T1 - Bidirectional scanning force microscopy probes with co-resonant sensitivity enhancement
AU - Reiche, Christopher F.
AU - Korner, Julia
AU - Buchner, Bernd
AU - Muhl, Thomas
N1 - Publisher Copyright: © 2015 IEEE.
PY - 2015
Y1 - 2015
N2 - In dynamic scanning force microscopy (dSFM) an oscillating micromechanical cantilever equipped with an interaction tip is used to provide sub-nanometer spatial resolution data on force gradient related properties of the tip-sample interaction. Our bidirectional dSFM probes provide lateral as well as perpendicular force gradient sensitivity with in-situ-switching capability between the operation directions by employing a special geometry and the first two flexural modes of the cantilever. These probes rely only on basic vertical excitation and detection schemes and are therefore compatible with standard dSFM equipment. A way to increase the sensitivity of the lateral mode is given by a co-resonant detection concept. In the framework of this concept the ease of detection of a micromechanical oscillator, in our case a microstructured cantilever, is combined with the high force gradient sensitivity of a nanomechanical low-stiffness and low-mass carbon nanotube oscillator. The resonance frequency of the nanotube is adjusted via mass deposition to be close to the lateral sensitivity resonance frequency of the cantilever. This ensures that the oscillatory state of the coupled cantilevernanotube system has an increased sensitivity to force gradients but still retains the easy detection of the oscillation of the cantilever. The amplified sensitivity is experimentally verified by comparing data on magnetic measurements acquired with such a co-resonant sensor with calculations for a standard bidirectional sensor.
AB - In dynamic scanning force microscopy (dSFM) an oscillating micromechanical cantilever equipped with an interaction tip is used to provide sub-nanometer spatial resolution data on force gradient related properties of the tip-sample interaction. Our bidirectional dSFM probes provide lateral as well as perpendicular force gradient sensitivity with in-situ-switching capability between the operation directions by employing a special geometry and the first two flexural modes of the cantilever. These probes rely only on basic vertical excitation and detection schemes and are therefore compatible with standard dSFM equipment. A way to increase the sensitivity of the lateral mode is given by a co-resonant detection concept. In the framework of this concept the ease of detection of a micromechanical oscillator, in our case a microstructured cantilever, is combined with the high force gradient sensitivity of a nanomechanical low-stiffness and low-mass carbon nanotube oscillator. The resonance frequency of the nanotube is adjusted via mass deposition to be close to the lateral sensitivity resonance frequency of the cantilever. This ensures that the oscillatory state of the coupled cantilevernanotube system has an increased sensitivity to force gradients but still retains the easy detection of the oscillation of the cantilever. The amplified sensitivity is experimentally verified by comparing data on magnetic measurements acquired with such a co-resonant sensor with calculations for a standard bidirectional sensor.
KW - Carbon Nanotubes
KW - Micro-to-nano-scale bridging
KW - NEMS
KW - Scanning Force Microscopy Probes
UR - http://www.scopus.com/inward/record.url?scp=84964378328&partnerID=8YFLogxK
U2 - 10.1109/NANO.2015.7388849
DO - 10.1109/NANO.2015.7388849
M3 - Conference contribution
AN - SCOPUS:84964378328
T3 - IEEE-NANO 2015 - 15th International Conference on Nanotechnology
SP - 1222
EP - 1225
BT - IEEE-NANO 2015 - 15th International Conference on Nanotechnology
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 15th IEEE International Conference on Nanotechnology, IEEE-NANO 2015
Y2 - 27 July 2015 through 30 July 2015
ER -