Automated Model Generation Including Variations for Formal Verification of Nonlinear Analog Circuits.

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Authors

  • Malgorzata Rechmal-Lesse
  • Gerald Alexander Koroa
  • Yeremia Gunawan Adhisantoso
  • Markus Olbrich
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Details

Original languageEnglish
Title of host publication2020 18th IEEE International New Circuits and Systems Conference (NEWCAS)
Pages66-69
Number of pages4
ISBN (electronic)9781728170442
Publication statusPublished - 2020

Abstract

With the advancements in analog/mixed-signal (AMS) systems and continuously shrinking design sizes, there is an increased demand for reliable verification to ensure correct behavior. To overcome this obstacle, using formal verification is a promising option. We present a modeling system that automatically provides dependable set-valued models from circuit netlists in a form suitable for reachability analysis. Our method is based on local linearizations of the nonlinear circuit. Linearized locations are computed on-the-fly depending on which states are reachable to avoid the state-space explosion problem. The set-valued models include device parameter variations, modeling errors and uncertain input stimuli.

Keywords

    Formal verification, Nonlinear analog circuit, Piecewise linear model, Reachability analysis, Uncertainties

ASJC Scopus subject areas

Cite this

Automated Model Generation Including Variations for Formal Verification of Nonlinear Analog Circuits. / Rechmal-Lesse, Malgorzata; Koroa, Gerald Alexander; Adhisantoso, Yeremia Gunawan et al.
2020 18th IEEE International New Circuits and Systems Conference (NEWCAS). 2020. p. 66-69 9159822.

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Rechmal-Lesse, M, Koroa, GA, Adhisantoso, YG & Olbrich, M 2020, Automated Model Generation Including Variations for Formal Verification of Nonlinear Analog Circuits. in 2020 18th IEEE International New Circuits and Systems Conference (NEWCAS)., 9159822, pp. 66-69. https://doi.org/10.1109/newcas49341.2020.9159822
Rechmal-Lesse, M., Koroa, G. A., Adhisantoso, Y. G., & Olbrich, M. (2020). Automated Model Generation Including Variations for Formal Verification of Nonlinear Analog Circuits. In 2020 18th IEEE International New Circuits and Systems Conference (NEWCAS) (pp. 66-69). Article 9159822 https://doi.org/10.1109/newcas49341.2020.9159822
Rechmal-Lesse M, Koroa GA, Adhisantoso YG, Olbrich M. Automated Model Generation Including Variations for Formal Verification of Nonlinear Analog Circuits. In 2020 18th IEEE International New Circuits and Systems Conference (NEWCAS). 2020. p. 66-69. 9159822 doi: 10.1109/newcas49341.2020.9159822
Rechmal-Lesse, Malgorzata ; Koroa, Gerald Alexander ; Adhisantoso, Yeremia Gunawan et al. / Automated Model Generation Including Variations for Formal Verification of Nonlinear Analog Circuits. 2020 18th IEEE International New Circuits and Systems Conference (NEWCAS). 2020. pp. 66-69
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