Details
| Original language | English |
|---|---|
| Article number | 114119 |
| Journal | Microelectronics Reliability |
| Volume | 121 |
| Early online date | 23 Apr 2021 |
| Publication status | Published - Jun 2021 |
Abstract
This paper tackles the analog and mixed-signal modeling for verification challenges. It proposes an adjustable automated modeling approach, which provides set-valued models with reduced overapproximation. The models reliably enclose parameter variations and modeling errors. The reduced overapproximation is obtained by computing the intersecting set of models with intervals and affine forms. The nonlinear circuit examples show a reduced overapproximation up to 86%.
Keywords
- Formal verification, Nonlinear analog circuit, Parameter variations, Piecewise linear model, Reachability analysis
ASJC Scopus subject areas
- Materials Science(all)
- Electronic, Optical and Magnetic Materials
- Physics and Astronomy(all)
- Atomic and Molecular Physics, and Optics
- Physics and Astronomy(all)
- Condensed Matter Physics
- Engineering(all)
- Safety, Risk, Reliability and Quality
- Materials Science(all)
- Surfaces, Coatings and Films
- Engineering(all)
- Electrical and Electronic Engineering
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In: Microelectronics Reliability, Vol. 121, 114119, 06.2021.
Research output: Contribution to journal › Article › Research › peer review
}
TY - JOUR
T1 - Automated Abstraction of Nonlinear Analog Circuits to Reliable Set-Valued Models with Reduced Overapproximation
AU - Rechmal-Lesse, Malgorzata
AU - Adhisantoso, Yeremia Gunawan
AU - Koroa, Gerald Alexander
AU - Olbrich, Markus
N1 - Funding Information: This work was partially funded by the Deutsche Forschungsgemeinschaft (DFG – German Research Foundation) under project faveAC under grant OL 121/4-1 .
PY - 2021/6
Y1 - 2021/6
N2 - This paper tackles the analog and mixed-signal modeling for verification challenges. It proposes an adjustable automated modeling approach, which provides set-valued models with reduced overapproximation. The models reliably enclose parameter variations and modeling errors. The reduced overapproximation is obtained by computing the intersecting set of models with intervals and affine forms. The nonlinear circuit examples show a reduced overapproximation up to 86%.
AB - This paper tackles the analog and mixed-signal modeling for verification challenges. It proposes an adjustable automated modeling approach, which provides set-valued models with reduced overapproximation. The models reliably enclose parameter variations and modeling errors. The reduced overapproximation is obtained by computing the intersecting set of models with intervals and affine forms. The nonlinear circuit examples show a reduced overapproximation up to 86%.
KW - Formal verification
KW - Nonlinear analog circuit
KW - Parameter variations
KW - Piecewise linear model
KW - Reachability analysis
UR - http://www.scopus.com/inward/record.url?scp=85105604640&partnerID=8YFLogxK
U2 - 10.1016/j.microrel.2021.114119
DO - 10.1016/j.microrel.2021.114119
M3 - Article
AN - SCOPUS:85105604640
VL - 121
JO - Microelectronics Reliability
JF - Microelectronics Reliability
SN - 0026-2714
M1 - 114119
ER -