Details
| Original language | English |
|---|---|
| Title of host publication | 2015 IEEE International Symposium on Electromagnetic Compatibility |
| Subtitle of host publication | EMC |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 1083-1088 |
| Number of pages | 6 |
| ISBN (electronic) | 9781479966158 |
| Publication status | Published - 2015 |
| Event | IEEE International Symposium on Electromagnetic Compatibility, EMC 2015 - Dresden, Germany Duration: 16 Aug 2015 → 22 Aug 2015 |
Publication series
| Name | IEEE International Symposium on Electromagnetic Compatibility |
|---|---|
| Volume | 2015-Septmber |
| ISSN (Print) | 1077-4076 |
| ISSN (electronic) | 2158-1118 |
Abstract
This paper discusses a technique which enables the assessment of key parameter of various intentional electromagnetic environments (IEME) for electronic systems, including the likelihood of their occurrence. The technique starts with a categorization of aspects, including non-technical aspects like availability of components, required knowledge and costs. Based on this categorization the likelihood that an offender has access to such an IEMI source is determined by a heuristic approach. In a second assessment step the possibility that a considered IEMI source might occur in the ambient of a given target system as well as parameters of the generated IEME are estimated.
Keywords
- assessment, categorisation, EM environment, IEMI source, intentional electromagnetic interference (IEMI), likelihood of occurance
ASJC Scopus subject areas
- Physics and Astronomy(all)
- Condensed Matter Physics
- Engineering(all)
- Electrical and Electronic Engineering
Cite this
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2015 IEEE International Symposium on Electromagnetic Compatibility: EMC. Institute of Electrical and Electronics Engineers Inc., 2015. p. 1083-1088 7256319 (IEEE International Symposium on Electromagnetic Compatibility; Vol. 2015-Septmber).
Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
}
TY - GEN
T1 - Assessing the Likelihood of Various Intentional Electromagnetic Environments
T2 - IEEE International Symposium on Electromagnetic Compatibility, EMC 2015
AU - Sabath, Frank
AU - Garbe, Heyno
PY - 2015
Y1 - 2015
N2 - This paper discusses a technique which enables the assessment of key parameter of various intentional electromagnetic environments (IEME) for electronic systems, including the likelihood of their occurrence. The technique starts with a categorization of aspects, including non-technical aspects like availability of components, required knowledge and costs. Based on this categorization the likelihood that an offender has access to such an IEMI source is determined by a heuristic approach. In a second assessment step the possibility that a considered IEMI source might occur in the ambient of a given target system as well as parameters of the generated IEME are estimated.
AB - This paper discusses a technique which enables the assessment of key parameter of various intentional electromagnetic environments (IEME) for electronic systems, including the likelihood of their occurrence. The technique starts with a categorization of aspects, including non-technical aspects like availability of components, required knowledge and costs. Based on this categorization the likelihood that an offender has access to such an IEMI source is determined by a heuristic approach. In a second assessment step the possibility that a considered IEMI source might occur in the ambient of a given target system as well as parameters of the generated IEME are estimated.
KW - assessment
KW - categorisation
KW - EM environment
KW - IEMI source
KW - intentional electromagnetic interference (IEMI)
KW - likelihood of occurance
UR - http://www.scopus.com/inward/record.url?scp=84953858527&partnerID=8YFLogxK
U2 - 10.1109/ISEMC.2015.7256319
DO - 10.1109/ISEMC.2015.7256319
M3 - Conference contribution
AN - SCOPUS:84953858527
T3 - IEEE International Symposium on Electromagnetic Compatibility
SP - 1083
EP - 1088
BT - 2015 IEEE International Symposium on Electromagnetic Compatibility
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 16 August 2015 through 22 August 2015
ER -