Details
| Original language | English |
|---|---|
| Title of host publication | 2008 IEEE International Symposium on Electromagnetic Compatibility |
| Subtitle of host publication | EMC |
| Publication status | Published - 2008 |
| Event | 2008 IEEE International Symposium on Electromagnetic Compatibility, EMC 2008 - Detroit, United States Duration: 18 Aug 2008 → 22 Aug 2008 |
Publication series
| Name | IEEE International Symposium on Electromagnetic Compatibility |
|---|---|
| ISSN (Print) | 1077-4076 |
Abstract
This paper concentrates on the usage of the IEC 61000-4-20, the international standard for emission and immunity testing in transverse electromagnetic (TEM) waveguides. The specifications for transient testing in TEM waveguides according to Annex C of the norm are verified by measurements with different waveguides (GTEM 1250 and GTEM 3750) and various excitation signals with a large bandwidth up to several GHz. The measurement results show that the norm can be enlarged related to the defined limits of the applied test signals and the usable testing volume in the waveguide.
Keywords
- IEC 61000-4-20, Transient measurements, Ultra wideband signal
ASJC Scopus subject areas
- Physics and Astronomy(all)
- Condensed Matter Physics
- Engineering(all)
- Electrical and Electronic Engineering
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2008 IEEE International Symposium on Electromagnetic Compatibility: EMC. 2008. (IEEE International Symposium on Electromagnetic Compatibility).
Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
}
TY - GEN
T1 - Aspects of Using the IEC 61000-4-20 for Transient Testing with Broadband Signals
AU - Thye, Holger
AU - Zamow, Dirk
AU - Koch, Michael
AU - Garbe, Heyno
PY - 2008
Y1 - 2008
N2 - This paper concentrates on the usage of the IEC 61000-4-20, the international standard for emission and immunity testing in transverse electromagnetic (TEM) waveguides. The specifications for transient testing in TEM waveguides according to Annex C of the norm are verified by measurements with different waveguides (GTEM 1250 and GTEM 3750) and various excitation signals with a large bandwidth up to several GHz. The measurement results show that the norm can be enlarged related to the defined limits of the applied test signals and the usable testing volume in the waveguide.
AB - This paper concentrates on the usage of the IEC 61000-4-20, the international standard for emission and immunity testing in transverse electromagnetic (TEM) waveguides. The specifications for transient testing in TEM waveguides according to Annex C of the norm are verified by measurements with different waveguides (GTEM 1250 and GTEM 3750) and various excitation signals with a large bandwidth up to several GHz. The measurement results show that the norm can be enlarged related to the defined limits of the applied test signals and the usable testing volume in the waveguide.
KW - IEC 61000-4-20
KW - Transient measurements
KW - Ultra wideband signal
UR - http://www.scopus.com/inward/record.url?scp=84890602585&partnerID=8YFLogxK
U2 - 10.1109/ISEMC.2008.4652025
DO - 10.1109/ISEMC.2008.4652025
M3 - Conference contribution
AN - SCOPUS:84890602585
T3 - IEEE International Symposium on Electromagnetic Compatibility
BT - 2008 IEEE International Symposium on Electromagnetic Compatibility
T2 - 2008 IEEE International Symposium on Electromagnetic Compatibility, EMC 2008
Y2 - 18 August 2008 through 22 August 2008
ER -