Applicability of the IEC 61000-4-20 for Transient Testing with UWB Signals

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Authors

  • Dirk Zamow
  • Holger Thye
  • Heyno Garbe
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Details

Original languageEnglish
Title of host publication2008 International Symposium on Electromagnetic Compatibility
Subtitle of host publicationEMC Europe
Publication statusPublished - 2008
Event2008 International Symposium on Electromagnetic Compatibility: EMC Europe 2008 - Hamburg, Germany
Duration: 8 Sept 200812 Sept 2008

Publication series

NameIEEE International Symposium on Electromagnetic Compatibility
ISSN (Print)1077-4076

Abstract

This contribution deals with the IEC 61000-4-20, the international standard for emission and immunity testing in transversal electromagnetic (TEM) waveguides. The applicability of the IEC standard's Annex C for transient testing with broadband signals is verified by measurements. The measurement results show that the standard can be extended to other fast rising pulses yielding the existing limits and definitions for field homogeneity in the usable testing volume. Additionally some new practical measurement techniques for testing with fast transient signals in GTEM cells are presented.

Keywords

    IEC 61000-4-20, Transient measurements, UWB

ASJC Scopus subject areas

Cite this

Applicability of the IEC 61000-4-20 for Transient Testing with UWB Signals. / Zamow, Dirk; Thye, Holger; Garbe, Heyno.
2008 International Symposium on Electromagnetic Compatibility: EMC Europe. 2008. (IEEE International Symposium on Electromagnetic Compatibility).

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Zamow, D, Thye, H & Garbe, H 2008, Applicability of the IEC 61000-4-20 for Transient Testing with UWB Signals. in 2008 International Symposium on Electromagnetic Compatibility: EMC Europe. IEEE International Symposium on Electromagnetic Compatibility, 2008 International Symposium on Electromagnetic Compatibility, Hamburg, Germany, 8 Sept 2008. https://doi.org/10.1109/EMCEUROPE.2008.4786900
Zamow, D., Thye, H., & Garbe, H. (2008). Applicability of the IEC 61000-4-20 for Transient Testing with UWB Signals. In 2008 International Symposium on Electromagnetic Compatibility: EMC Europe (IEEE International Symposium on Electromagnetic Compatibility). https://doi.org/10.1109/EMCEUROPE.2008.4786900
Zamow D, Thye H, Garbe H. Applicability of the IEC 61000-4-20 for Transient Testing with UWB Signals. In 2008 International Symposium on Electromagnetic Compatibility: EMC Europe. 2008. (IEEE International Symposium on Electromagnetic Compatibility). doi: 10.1109/EMCEUROPE.2008.4786900
Zamow, Dirk ; Thye, Holger ; Garbe, Heyno. / Applicability of the IEC 61000-4-20 for Transient Testing with UWB Signals. 2008 International Symposium on Electromagnetic Compatibility: EMC Europe. 2008. (IEEE International Symposium on Electromagnetic Compatibility).
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@inproceedings{d28ac6826868450fb630c0a85e277bbe,
title = "Applicability of the IEC 61000-4-20 for Transient Testing with UWB Signals",
abstract = "This contribution deals with the IEC 61000-4-20, the international standard for emission and immunity testing in transversal electromagnetic (TEM) waveguides. The applicability of the IEC standard's Annex C for transient testing with broadband signals is verified by measurements. The measurement results show that the standard can be extended to other fast rising pulses yielding the existing limits and definitions for field homogeneity in the usable testing volume. Additionally some new practical measurement techniques for testing with fast transient signals in GTEM cells are presented.",
keywords = "IEC 61000-4-20, Transient measurements, UWB",
author = "Dirk Zamow and Holger Thye and Heyno Garbe",
year = "2008",
doi = "10.1109/EMCEUROPE.2008.4786900",
language = "English",
series = "IEEE International Symposium on Electromagnetic Compatibility",
booktitle = "2008 International Symposium on Electromagnetic Compatibility",
note = "2008 International Symposium on Electromagnetic Compatibility : EMC Europe 2008 ; Conference date: 08-09-2008 Through 12-09-2008",

}

Download

TY - GEN

T1 - Applicability of the IEC 61000-4-20 for Transient Testing with UWB Signals

AU - Zamow, Dirk

AU - Thye, Holger

AU - Garbe, Heyno

PY - 2008

Y1 - 2008

N2 - This contribution deals with the IEC 61000-4-20, the international standard for emission and immunity testing in transversal electromagnetic (TEM) waveguides. The applicability of the IEC standard's Annex C for transient testing with broadband signals is verified by measurements. The measurement results show that the standard can be extended to other fast rising pulses yielding the existing limits and definitions for field homogeneity in the usable testing volume. Additionally some new practical measurement techniques for testing with fast transient signals in GTEM cells are presented.

AB - This contribution deals with the IEC 61000-4-20, the international standard for emission and immunity testing in transversal electromagnetic (TEM) waveguides. The applicability of the IEC standard's Annex C for transient testing with broadband signals is verified by measurements. The measurement results show that the standard can be extended to other fast rising pulses yielding the existing limits and definitions for field homogeneity in the usable testing volume. Additionally some new practical measurement techniques for testing with fast transient signals in GTEM cells are presented.

KW - IEC 61000-4-20

KW - Transient measurements

KW - UWB

UR - http://www.scopus.com/inward/record.url?scp=63549102192&partnerID=8YFLogxK

U2 - 10.1109/EMCEUROPE.2008.4786900

DO - 10.1109/EMCEUROPE.2008.4786900

M3 - Conference contribution

AN - SCOPUS:63549102192

T3 - IEEE International Symposium on Electromagnetic Compatibility

BT - 2008 International Symposium on Electromagnetic Compatibility

T2 - 2008 International Symposium on Electromagnetic Compatibility

Y2 - 8 September 2008 through 12 September 2008

ER -