Details
| Original language | English |
|---|---|
| Pages (from-to) | 805-814 |
| Number of pages | 10 |
| Journal | IEEE journal of photovoltaics |
| Volume | 12 |
| Issue number | 3 |
| Publication status | Published - 23 Mar 2022 |
Abstract
In this article, we present a new method to measure electroluminescence (EL) images of current half-cell PV modules without opening electrical contacts. The method uses the series parallel interconnection of the substrings in the module to power one module half (luminescence part) by illumination of the other module half (generator part). The defect interpretation of the resulting images changes slightly compared to usual EL images. Module defects in the generator part of the module influence the working point of the EL of the luminescence part. The new method has a practical limitation, as an electrical power of about 12.4 kW would be required for bringing the luminescent part into the operating point of the rated short-circuit current. Using infrared light emitting diodes and a working point of half of the nominal short-circuit power brings the needed power down to about 2.4 kW for a 144-cell module. For current Si-based PV modules, the method allows image acquisition times below 1 s per image with conventional silicon sensor-based cameras.
Keywords
- Characterization, electroluminescence (EL), half-cell PV modules
ASJC Scopus subject areas
- Materials Science(all)
- Electronic, Optical and Magnetic Materials
- Physics and Astronomy(all)
- Condensed Matter Physics
- Engineering(all)
- Electrical and Electronic Engineering
Sustainable Development Goals
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In: IEEE journal of photovoltaics, Vol. 12, No. 3, 23.03.2022, p. 805-814.
Research output: Contribution to journal › Article › Research › peer review
}
TY - JOUR
T1 - Applicability of Light Induced Luminescence for Characterization of Internal Series-Parallel Connected Photovoltaic Modules
AU - Köntges, Marc
AU - Wagner, Jan
AU - Siebert, Michael
AU - Bordihn, Stefan
AU - Schinke, Carsten
PY - 2022/3/23
Y1 - 2022/3/23
N2 - In this article, we present a new method to measure electroluminescence (EL) images of current half-cell PV modules without opening electrical contacts. The method uses the series parallel interconnection of the substrings in the module to power one module half (luminescence part) by illumination of the other module half (generator part). The defect interpretation of the resulting images changes slightly compared to usual EL images. Module defects in the generator part of the module influence the working point of the EL of the luminescence part. The new method has a practical limitation, as an electrical power of about 12.4 kW would be required for bringing the luminescent part into the operating point of the rated short-circuit current. Using infrared light emitting diodes and a working point of half of the nominal short-circuit power brings the needed power down to about 2.4 kW for a 144-cell module. For current Si-based PV modules, the method allows image acquisition times below 1 s per image with conventional silicon sensor-based cameras.
AB - In this article, we present a new method to measure electroluminescence (EL) images of current half-cell PV modules without opening electrical contacts. The method uses the series parallel interconnection of the substrings in the module to power one module half (luminescence part) by illumination of the other module half (generator part). The defect interpretation of the resulting images changes slightly compared to usual EL images. Module defects in the generator part of the module influence the working point of the EL of the luminescence part. The new method has a practical limitation, as an electrical power of about 12.4 kW would be required for bringing the luminescent part into the operating point of the rated short-circuit current. Using infrared light emitting diodes and a working point of half of the nominal short-circuit power brings the needed power down to about 2.4 kW for a 144-cell module. For current Si-based PV modules, the method allows image acquisition times below 1 s per image with conventional silicon sensor-based cameras.
KW - Characterization
KW - electroluminescence (EL)
KW - half-cell PV modules
UR - http://www.scopus.com/inward/record.url?scp=85127023399&partnerID=8YFLogxK
U2 - 10.1109/JPHOTOV.2022.3156727
DO - 10.1109/JPHOTOV.2022.3156727
M3 - Article
AN - SCOPUS:85127023399
VL - 12
SP - 805
EP - 814
JO - IEEE journal of photovoltaics
JF - IEEE journal of photovoltaics
SN - 2156-3381
IS - 3
ER -