Details
| Original language | English |
|---|---|
| Title of host publication | 39th IEEE Photovoltaic Specialists Conference, PVSC 2013 |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 203-208 |
| Number of pages | 6 |
| ISBN (print) | 9781479932993 |
| Publication status | Published - 2013 |
| Event | 39th IEEE Photovoltaic Specialists Conference, PVSC 2013 - Tampa, FL, United States Duration: 16 Jun 2013 → 21 Jun 2013 |
Publication series
| Name | Conference Record of the IEEE Photovoltaic Specialists Conference |
|---|---|
| ISSN (Print) | 0160-8371 |
Abstract
We present an analytical expression for modelling electroluminescence (EL) as well as photoluminescence (PL) data of samples with any combination of planar and arbitrary rough surfaces. The model also accounts for free carrier absorption in highly doped regions of the sample. It is experimentally confirmed by comparison to measured EL and PL spectra of solar cells and wafers featuring different surface geometries. Significant differences in the absorption coefficient data available from literature, which enters the model as tabulated data, are revealed. Using our model, the absorption data by Daub yields the best agreement to the measured luminescence spectra. Moreover, we present a method to determine the rear surface reflectance of samples from the peak wavelength of luminescence spectra.
Keywords
- Charge carrier distribution, Luminescence, Photon escape probability
ASJC Scopus subject areas
- Engineering(all)
- Control and Systems Engineering
- Engineering(all)
- Industrial and Manufacturing Engineering
- Engineering(all)
- Electrical and Electronic Engineering
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39th IEEE Photovoltaic Specialists Conference, PVSC 2013. Institute of Electrical and Electronics Engineers Inc., 2013. p. 203-208 6744131 (Conference Record of the IEEE Photovoltaic Specialists Conference).
Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
}
TY - GEN
T1 - Analyzing the spectral luminescence emission of silicon solar cells and wafers
AU - Schinke, Carsten
AU - Hinken, David
AU - Bothe, Karsten
AU - Schmidt, Jan
AU - Brendel, Rolf
PY - 2013
Y1 - 2013
N2 - We present an analytical expression for modelling electroluminescence (EL) as well as photoluminescence (PL) data of samples with any combination of planar and arbitrary rough surfaces. The model also accounts for free carrier absorption in highly doped regions of the sample. It is experimentally confirmed by comparison to measured EL and PL spectra of solar cells and wafers featuring different surface geometries. Significant differences in the absorption coefficient data available from literature, which enters the model as tabulated data, are revealed. Using our model, the absorption data by Daub yields the best agreement to the measured luminescence spectra. Moreover, we present a method to determine the rear surface reflectance of samples from the peak wavelength of luminescence spectra.
AB - We present an analytical expression for modelling electroluminescence (EL) as well as photoluminescence (PL) data of samples with any combination of planar and arbitrary rough surfaces. The model also accounts for free carrier absorption in highly doped regions of the sample. It is experimentally confirmed by comparison to measured EL and PL spectra of solar cells and wafers featuring different surface geometries. Significant differences in the absorption coefficient data available from literature, which enters the model as tabulated data, are revealed. Using our model, the absorption data by Daub yields the best agreement to the measured luminescence spectra. Moreover, we present a method to determine the rear surface reflectance of samples from the peak wavelength of luminescence spectra.
KW - Charge carrier distribution
KW - Luminescence
KW - Photon escape probability
UR - http://www.scopus.com/inward/record.url?scp=84896470785&partnerID=8YFLogxK
U2 - 10.1109/PVSC.2013.6744131
DO - 10.1109/PVSC.2013.6744131
M3 - Conference contribution
AN - SCOPUS:84896470785
SN - 9781479932993
T3 - Conference Record of the IEEE Photovoltaic Specialists Conference
SP - 203
EP - 208
BT - 39th IEEE Photovoltaic Specialists Conference, PVSC 2013
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 39th IEEE Photovoltaic Specialists Conference, PVSC 2013
Y2 - 16 June 2013 through 21 June 2013
ER -