Analysis of the Wire/Substrate Interface during Ultrasonic Bonding Process

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Authors

  • Yangyang Long
  • Folke Dencker
  • Andreas Isaak
  • Chun Li
  • Marc Wurz
  • Jens Twiefel
  • Jorg Wallaschek
  • Friedrich Schneider
  • Jorg Hermsdorf

External Research Organisations

  • Laser Zentrum Hannover e.V. (LZH)
View graph of relations

Details

Original languageEnglish
Title of host publication2017 IEEE CPMT Symposium Japan (ICSJ)
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages203-206
Number of pages4
ISBN (electronic)9781538627129
ISBN (print)978-1-5386-2713-6
Publication statusPublished - 28 Dec 2017
Event2017 IEEE CPMT Symposium Japan (ICSJ) - Kyoto, Japan
Duration: 20 Nov 201722 Nov 2017

Keywords

    real-time observation, ultrasonic wire bonding, wire/substrate interface

ASJC Scopus subject areas

Cite this

Analysis of the Wire/Substrate Interface during Ultrasonic Bonding Process. / Long, Yangyang; Dencker, Folke; Isaak, Andreas et al.
2017 IEEE CPMT Symposium Japan (ICSJ). Institute of Electrical and Electronics Engineers Inc., 2017. p. 203-206.

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Long, Y, Dencker, F, Isaak, A, Li, C, Wurz, M, Twiefel, J, Wallaschek, J, Schneider, F & Hermsdorf, J 2017, Analysis of the Wire/Substrate Interface during Ultrasonic Bonding Process. in 2017 IEEE CPMT Symposium Japan (ICSJ). Institute of Electrical and Electronics Engineers Inc., pp. 203-206, 2017 IEEE CPMT Symposium Japan (ICSJ), Kyoto, Japan, 20 Nov 2017. https://doi.org/10.1109/ICSJ.2017.8240117
Long, Y., Dencker, F., Isaak, A., Li, C., Wurz, M., Twiefel, J., Wallaschek, J., Schneider, F., & Hermsdorf, J. (2017). Analysis of the Wire/Substrate Interface during Ultrasonic Bonding Process. In 2017 IEEE CPMT Symposium Japan (ICSJ) (pp. 203-206). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICSJ.2017.8240117
Long Y, Dencker F, Isaak A, Li C, Wurz M, Twiefel J et al. Analysis of the Wire/Substrate Interface during Ultrasonic Bonding Process. In 2017 IEEE CPMT Symposium Japan (ICSJ). Institute of Electrical and Electronics Engineers Inc. 2017. p. 203-206 doi: 10.1109/ICSJ.2017.8240117
Long, Yangyang ; Dencker, Folke ; Isaak, Andreas et al. / Analysis of the Wire/Substrate Interface during Ultrasonic Bonding Process. 2017 IEEE CPMT Symposium Japan (ICSJ). Institute of Electrical and Electronics Engineers Inc., 2017. pp. 203-206
Download
@inproceedings{67290f204ab44391908412528fd74a32,
title = "Analysis of the Wire/Substrate Interface during Ultrasonic Bonding Process",
keywords = "real-time observation, ultrasonic wire bonding, wire/substrate interface",
author = "Yangyang Long and Folke Dencker and Andreas Isaak and Chun Li and Marc Wurz and Jens Twiefel and Jorg Wallaschek and Friedrich Schneider and Jorg Hermsdorf",
note = "Funding information: This work is supported by DFG (Deutsche Forschungs-gemeinschaft) programm (TW75/8-1|WA564/40-1|WU 558/11 -1). Many thanks to Hesse Mechatronics GmbH for providing the bonding head HBK05.; 2017 IEEE CPMT Symposium Japan (ICSJ), ICSJ ; Conference date: 20-11-2017 Through 22-11-2017",
year = "2017",
month = dec,
day = "28",
doi = "10.1109/ICSJ.2017.8240117",
language = "English",
isbn = "978-1-5386-2713-6",
pages = "203--206",
booktitle = "2017 IEEE CPMT Symposium Japan (ICSJ)",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
address = "United States",

}

Download

TY - GEN

T1 - Analysis of the Wire/Substrate Interface during Ultrasonic Bonding Process

AU - Long, Yangyang

AU - Dencker, Folke

AU - Isaak, Andreas

AU - Li, Chun

AU - Wurz, Marc

AU - Twiefel, Jens

AU - Wallaschek, Jorg

AU - Schneider, Friedrich

AU - Hermsdorf, Jorg

N1 - Funding information: This work is supported by DFG (Deutsche Forschungs-gemeinschaft) programm (TW75/8-1|WA564/40-1|WU 558/11 -1). Many thanks to Hesse Mechatronics GmbH for providing the bonding head HBK05.

PY - 2017/12/28

Y1 - 2017/12/28

KW - real-time observation

KW - ultrasonic wire bonding

KW - wire/substrate interface

UR - http://www.scopus.com/inward/record.url?scp=85044444005&partnerID=8YFLogxK

U2 - 10.1109/ICSJ.2017.8240117

DO - 10.1109/ICSJ.2017.8240117

M3 - Conference contribution

AN - SCOPUS:85044444005

SN - 978-1-5386-2713-6

SP - 203

EP - 206

BT - 2017 IEEE CPMT Symposium Japan (ICSJ)

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2017 IEEE CPMT Symposium Japan (ICSJ)

Y2 - 20 November 2017 through 22 November 2017

ER -

By the same author(s)