Analysis of peak shapes in X-ray diffractometry (GUINIER geometry) of standard materials using asymmetric profile functions

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Authors

External Research Organisations

  • University of Konstanz
  • Ludwig-Maximilians-Universität München (LMU)
  • Instytut Chemii Bioorganicznej Polskiej Akademii Nauk
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Details

Original languageEnglish
Pages (from-to)89-94
Number of pages6
JournalMaterials Science Forum
Volume228-231
Issue numberPART 1
Publication statusPublished - Dec 1996
Externally publishedYes

Abstract

X-ray diffraction peaks of α-AI2O3 (NIST-Standard No 679) and Si obtained in the asymmetric transmission mode of the GUINIER geometry are fitted with asymmetrized functions. Best fits are obtained with an asymmetrized pseudo-VOIGT function. The fitted parameters (FWHM and asymmetry) for each component (gaussian and lorentzian) and their mixing coefficient show systematic trends against the diffraction angle 2θ. The applied function is found to be well suited for fitting strongly asymmetric peaks measured on a GUINIER diffractometer.

Keywords

    Asymmetric Profile Functions, GUINIER Geometry, Peak Shape Analysis

ASJC Scopus subject areas

Cite this

Analysis of peak shapes in X-ray diffractometry (GUINIER geometry) of standard materials using asymmetric profile functions. / Schneider, A. M.; Paszkowicz, W.; Behrens, P. et al.
In: Materials Science Forum, Vol. 228-231, No. PART 1, 12.1996, p. 89-94.

Research output: Contribution to journalArticleResearchpeer review

Schneider, AM, Paszkowicz, W, Behrens, P & Felsche, J 1996, 'Analysis of peak shapes in X-ray diffractometry (GUINIER geometry) of standard materials using asymmetric profile functions', Materials Science Forum, vol. 228-231, no. PART 1, pp. 89-94.
Schneider, A. M., Paszkowicz, W., Behrens, P., & Felsche, J. (1996). Analysis of peak shapes in X-ray diffractometry (GUINIER geometry) of standard materials using asymmetric profile functions. Materials Science Forum, 228-231(PART 1), 89-94.
Schneider AM, Paszkowicz W, Behrens P, Felsche J. Analysis of peak shapes in X-ray diffractometry (GUINIER geometry) of standard materials using asymmetric profile functions. Materials Science Forum. 1996 Dec;228-231(PART 1):89-94.
Schneider, A. M. ; Paszkowicz, W. ; Behrens, P. et al. / Analysis of peak shapes in X-ray diffractometry (GUINIER geometry) of standard materials using asymmetric profile functions. In: Materials Science Forum. 1996 ; Vol. 228-231, No. PART 1. pp. 89-94.
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@article{7f3fada84985450eadbd067b6ebf3e89,
title = "Analysis of peak shapes in X-ray diffractometry (GUINIER geometry) of standard materials using asymmetric profile functions",
abstract = "X-ray diffraction peaks of α-AI2O3 (NIST-Standard No 679) and Si obtained in the asymmetric transmission mode of the GUINIER geometry are fitted with asymmetrized functions. Best fits are obtained with an asymmetrized pseudo-VOIGT function. The fitted parameters (FWHM and asymmetry) for each component (gaussian and lorentzian) and their mixing coefficient show systematic trends against the diffraction angle 2θ. The applied function is found to be well suited for fitting strongly asymmetric peaks measured on a GUINIER diffractometer.",
keywords = "Asymmetric Profile Functions, GUINIER Geometry, Peak Shape Analysis",
author = "Schneider, {A. M.} and W. Paszkowicz and P. Behrens and J. Felsche",
year = "1996",
month = dec,
language = "English",
volume = "228-231",
pages = "89--94",
number = "PART 1",

}

Download

TY - JOUR

T1 - Analysis of peak shapes in X-ray diffractometry (GUINIER geometry) of standard materials using asymmetric profile functions

AU - Schneider, A. M.

AU - Paszkowicz, W.

AU - Behrens, P.

AU - Felsche, J.

PY - 1996/12

Y1 - 1996/12

N2 - X-ray diffraction peaks of α-AI2O3 (NIST-Standard No 679) and Si obtained in the asymmetric transmission mode of the GUINIER geometry are fitted with asymmetrized functions. Best fits are obtained with an asymmetrized pseudo-VOIGT function. The fitted parameters (FWHM and asymmetry) for each component (gaussian and lorentzian) and their mixing coefficient show systematic trends against the diffraction angle 2θ. The applied function is found to be well suited for fitting strongly asymmetric peaks measured on a GUINIER diffractometer.

AB - X-ray diffraction peaks of α-AI2O3 (NIST-Standard No 679) and Si obtained in the asymmetric transmission mode of the GUINIER geometry are fitted with asymmetrized functions. Best fits are obtained with an asymmetrized pseudo-VOIGT function. The fitted parameters (FWHM and asymmetry) for each component (gaussian and lorentzian) and their mixing coefficient show systematic trends against the diffraction angle 2θ. The applied function is found to be well suited for fitting strongly asymmetric peaks measured on a GUINIER diffractometer.

KW - Asymmetric Profile Functions

KW - GUINIER Geometry

KW - Peak Shape Analysis

UR - http://www.scopus.com/inward/record.url?scp=3743091616&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:3743091616

VL - 228-231

SP - 89

EP - 94

JO - Materials Science Forum

JF - Materials Science Forum

SN - 0255-5476

IS - PART 1

ER -

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