An Overview of Modified Semiparametric Memory Estimation Methods

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Authors

  • Marie Busch
  • Philipp Sibbertsen

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Original languageEnglish
Article number13
JournalEconometrics
Volume6
Issue number1
Publication statusPublished - 12 Mar 2018

Abstract

Several modified estimation methods of the memory parameter have been introduced in the past years. They aim to decrease the upward bias of the memory parameter in cases of low frequency contaminations or an additive noise component, especially in situations with a short-memory process being contaminated. In this paper, we provide an overview and compare the performance of nine semiparametric estimation methods. Among them are two standard methods, four modified approaches to account for low frequency contaminations and three procedures developed for perturbed fractional processes. We conduct an extensive Monte Carlo study for a variety of parameter constellations and several DGPs. Furthermore, an empirical application of the log-absolute return series of the S&P 500 shows that the estimation results combined with a long-memory test indicate a spurious long-memory process.

Keywords

    Low frequency contamination, Monte Carlo simulation, Perturbation, Semiparametric estimation, Spurious long memory

ASJC Scopus subject areas

Cite this

An Overview of Modified Semiparametric Memory Estimation Methods. / Busch, Marie; Sibbertsen, Philipp.
In: Econometrics, Vol. 6, No. 1, 13, 12.03.2018.

Research output: Contribution to journalArticleResearchpeer review

Busch M, Sibbertsen P. An Overview of Modified Semiparametric Memory Estimation Methods. Econometrics. 2018 Mar 12;6(1):13. doi: 10.3390/econometrics6010013, 10.15488/4288
Busch, Marie ; Sibbertsen, Philipp. / An Overview of Modified Semiparametric Memory Estimation Methods. In: Econometrics. 2018 ; Vol. 6, No. 1.
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