Details
| Original language | English |
|---|---|
| Title of host publication | 47th ARFTG Conference Digest - Spring 1996 |
| Subtitle of host publication | High Power RF/Microwave Device Measurements, ARFTG 1996 |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 102-111 |
| Number of pages | 10 |
| ISBN (electronic) | 0780356861, 9780780356863 |
| Publication status | Published - 1996 |
| Event | 47th ARFTG Conference, ARFTG 1996 - San Francisco, United States Duration: 20 Jun 1996 → 21 Jun 1996 |
Publication series
| Name | 47th ARFTG Conference Digest - Spring 1996: High Power RF/Microwave Device Measurements, ARFTG 1996 |
|---|
Abstract
Error networks that include contact structures and which embed devices under measurement (DUM) can often be partitioned into different line segments having constant line widths. The basic idea of the here proposed deembedding procedure is the calculation of the error network from a piece by piece characterization of the line segments. In the first step of the proposed deembedding method, the propagation constants and the characteristic impedances of the various line segments are calculated from high frequency S-parameter measurements. In the second step, the chain parameter matrix A seg of the different line segments are then calculated. The third step consists of the calculation of the chain parameter matrix A error of the complete error network. Finally, one can calculate the scattering chain parameter matrix T error from the related chain parameter matrix A' error of the complete error network. The main advantage of this method lies in the fact that only thru lines with different line lengths have to be measured. A further advantage of this deembedding procedure is that the error networks embedding different DUM's can contain line segments of arbitrary line lengths. Therefore, the proposed deembedding procedure can be used for DUM's that are embedded in error networks that consist of different line segments with constant line widths.
ASJC Scopus subject areas
- Engineering(all)
- Electrical and Electronic Engineering
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47th ARFTG Conference Digest - Spring 1996: High Power RF/Microwave Device Measurements, ARFTG 1996. Institute of Electrical and Electronics Engineers Inc., 1996. p. 102-111 4119842 (47th ARFTG Conference Digest - Spring 1996: High Power RF/Microwave Device Measurements, ARFTG 1996).
Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
}
TY - GEN
T1 - An on-wafer deembedding procedure for devices under measurement with error-networks containing arbitrary line lengths
AU - Winkel, Thomas Michael
AU - Dutta, Lohit Sagar
AU - Grabinski, Hartmut
PY - 1996
Y1 - 1996
N2 - Error networks that include contact structures and which embed devices under measurement (DUM) can often be partitioned into different line segments having constant line widths. The basic idea of the here proposed deembedding procedure is the calculation of the error network from a piece by piece characterization of the line segments. In the first step of the proposed deembedding method, the propagation constants and the characteristic impedances of the various line segments are calculated from high frequency S-parameter measurements. In the second step, the chain parameter matrix A seg of the different line segments are then calculated. The third step consists of the calculation of the chain parameter matrix A error of the complete error network. Finally, one can calculate the scattering chain parameter matrix T error from the related chain parameter matrix A' error of the complete error network. The main advantage of this method lies in the fact that only thru lines with different line lengths have to be measured. A further advantage of this deembedding procedure is that the error networks embedding different DUM's can contain line segments of arbitrary line lengths. Therefore, the proposed deembedding procedure can be used for DUM's that are embedded in error networks that consist of different line segments with constant line widths.
AB - Error networks that include contact structures and which embed devices under measurement (DUM) can often be partitioned into different line segments having constant line widths. The basic idea of the here proposed deembedding procedure is the calculation of the error network from a piece by piece characterization of the line segments. In the first step of the proposed deembedding method, the propagation constants and the characteristic impedances of the various line segments are calculated from high frequency S-parameter measurements. In the second step, the chain parameter matrix A seg of the different line segments are then calculated. The third step consists of the calculation of the chain parameter matrix A error of the complete error network. Finally, one can calculate the scattering chain parameter matrix T error from the related chain parameter matrix A' error of the complete error network. The main advantage of this method lies in the fact that only thru lines with different line lengths have to be measured. A further advantage of this deembedding procedure is that the error networks embedding different DUM's can contain line segments of arbitrary line lengths. Therefore, the proposed deembedding procedure can be used for DUM's that are embedded in error networks that consist of different line segments with constant line widths.
UR - http://www.scopus.com/inward/record.url?scp=15944400532&partnerID=8YFLogxK
U2 - 10.1109/ARFTG.1996.327170
DO - 10.1109/ARFTG.1996.327170
M3 - Conference contribution
AN - SCOPUS:15944400532
T3 - 47th ARFTG Conference Digest - Spring 1996: High Power RF/Microwave Device Measurements, ARFTG 1996
SP - 102
EP - 111
BT - 47th ARFTG Conference Digest - Spring 1996
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 47th ARFTG Conference, ARFTG 1996
Y2 - 20 June 1996 through 21 June 1996
ER -