Details
| Original language | German |
|---|---|
| Title of host publication | ICT.OPEN Proceedings 2017 |
| Number of pages | 18 |
| Publication status | Published - 2017 |
| Event | ICT.OPEN 2017 - Amersfoort, Netherlands Duration: 21 Mar 2017 → 22 Mar 2017 |
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An Integrated Heated Testbench for Characterizing High Temperature ICs. / Webering, Fritz; Payá Vayá, Guillermo; Aditya, Evan et al.
ICT.OPEN Proceedings 2017. 2017.
ICT.OPEN Proceedings 2017. 2017.
Research output: Chapter in book/report/conference proceeding › Conference contribution › Research
Webering, F, Payá Vayá, G, Aditya, E, Dürre, JC & Blume, HC 2017, An Integrated Heated Testbench for Characterizing High Temperature ICs. in ICT.OPEN Proceedings 2017. ICT.OPEN 2017, Amersfoort, Netherlands, 21 Mar 2017. https://doi.org/10.15488/13694
Webering, F., Payá Vayá, G., Aditya, E., Dürre, J. C., & Blume, H. C. (2017). An Integrated Heated Testbench for Characterizing High Temperature ICs. In ICT.OPEN Proceedings 2017 https://doi.org/10.15488/13694
Webering F, Payá Vayá G, Aditya E, Dürre JC, Blume HC. An Integrated Heated Testbench for Characterizing High Temperature ICs. In ICT.OPEN Proceedings 2017. 2017 doi: 10.15488/13694
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@inproceedings{d3cc1119282f4d44babfcbf7d16a013c,
title = "An Integrated Heated Testbench for Characterizing High Temperature ICs",
author = "Fritz Webering and {Pay{\'a} Vay{\'a}}, Guillermo and Evan Aditya and D{\"u}rre, {Jan Christoph} and Blume, {Holger Christoph}",
year = "2017",
doi = "10.15488/13694",
language = "Deutsch",
isbn = "978-94-92579-027",
booktitle = "ICT.OPEN Proceedings 2017",
note = "ICT.OPEN 2017 ; Conference date: 21-03-2017 Through 22-03-2017",
}
Download
TY - GEN
T1 - An Integrated Heated Testbench for Characterizing High Temperature ICs
AU - Webering, Fritz
AU - Payá Vayá, Guillermo
AU - Aditya, Evan
AU - Dürre, Jan Christoph
AU - Blume, Holger Christoph
PY - 2017
Y1 - 2017
U2 - 10.15488/13694
DO - 10.15488/13694
M3 - Aufsatz in Konferenzband
SN - 978-94-92579-027
BT - ICT.OPEN Proceedings 2017
T2 - ICT.OPEN 2017
Y2 - 21 March 2017 through 22 March 2017
ER -