An improved method to detect riblets on surfaces in nanometer scaling using SEM

Research output: Chapter in book/report/conference proceeding › Contribution to book/anthology › Research › peer review

Authors

  • E. Reithmeier
  • T. Vynnyk

Research Organisations

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Details

Original languageEnglish
Title of host publicationFrom Nano to Space
Subtitle of host publicationApplied Mathematics Inspired by Roland Bulirsch
Pages43-54
Number of pages12
Publication statusPublished - 2008

Abstract

An improved photometric method for recording a 3D-microtopogrpahy of technical surfaces will be presented. The suggested procedure employs a scanning electron microscope (SEM) as multi-detector system. The improvement in measurement is based on an extended model of the electron detection in order to evaluate the detectors signals in a different way compared to known approaches. The method will be applied on a calibration sphere in order to demonstrate the accuracy of the current approach.

ASJC Scopus subject areas

Cite this

An improved method to detect riblets on surfaces in nanometer scaling using SEM. / Reithmeier, E.; Vynnyk, T.
From Nano to Space: Applied Mathematics Inspired by Roland Bulirsch. 2008. p. 43-54.

Research output: Chapter in book/report/conference proceeding › Contribution to book/anthology › Research › peer review

Reithmeier, E & Vynnyk, T 2008, An improved method to detect riblets on surfaces in nanometer scaling using SEM. in From Nano to Space: Applied Mathematics Inspired by Roland Bulirsch. pp. 43-54. https://doi.org/10.1007/978-3-540-74238-8_5
Reithmeier, E., & Vynnyk, T. (2008). An improved method to detect riblets on surfaces in nanometer scaling using SEM. In From Nano to Space: Applied Mathematics Inspired by Roland Bulirsch (pp. 43-54) https://doi.org/10.1007/978-3-540-74238-8_5
Reithmeier E, Vynnyk T. An improved method to detect riblets on surfaces in nanometer scaling using SEM. In From Nano to Space: Applied Mathematics Inspired by Roland Bulirsch. 2008. p. 43-54 doi: 10.1007/978-3-540-74238-8_5
Reithmeier, E. ; Vynnyk, T. / An improved method to detect riblets on surfaces in nanometer scaling using SEM. From Nano to Space: Applied Mathematics Inspired by Roland Bulirsch. 2008. pp. 43-54
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