Details
Original language | English |
---|---|
Pages (from-to) | 35-48 |
Number of pages | 14 |
Journal | Integration, the VLSI Journal |
Volume | 7 |
Issue number | 1 |
Publication status | Published - Apr 1989 |
Abstract
An algorithm for the computation of signal propagation in lossy interconnect systems at the chip as well as at the board level is presented. The algorithm allows us to handle effects like delay, dispersion, reflection, and electromagnetic coupling sufficiently. Especially for large systems of lines these effects cannot be treated by existing general purpose network analysis programs because of excessive computer runtime and numerical instabilities. To be able to handle line systems in a nonlinear circuit environment (e.g. CMOS inverters) the algorithm operates in the time domain. It is implemented in a computer program called LISIM which yields high accuracy, good stability, and small computation time. Simulation results are given for on-chip line systems of medium size based on the slow-wave mode. All simulations shown here were run on a 12 Mflops computer. The required computation time was about 2.4-60 s depending on the size of the nonlinear circuit environment, the used features and the desired accuracy for the simulation.
Keywords
- electromagnetic coupling, interconnect systems, lossy line system, signal propagation, time domain simulation
ASJC Scopus subject areas
- Computer Science(all)
- Software
- Computer Science(all)
- Hardware and Architecture
- Engineering(all)
- Electrical and Electronic Engineering
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In: Integration, the VLSI Journal, Vol. 7, No. 1, 04.1989, p. 35-48.
Research output: Contribution to journal › Article › Research › peer review
}
TY - JOUR
T1 - An algorithm for computing the signal propagation on lossy VLSI interconnect systems in the time domain
AU - Grabinski, Hartmut
PY - 1989/4
Y1 - 1989/4
N2 - An algorithm for the computation of signal propagation in lossy interconnect systems at the chip as well as at the board level is presented. The algorithm allows us to handle effects like delay, dispersion, reflection, and electromagnetic coupling sufficiently. Especially for large systems of lines these effects cannot be treated by existing general purpose network analysis programs because of excessive computer runtime and numerical instabilities. To be able to handle line systems in a nonlinear circuit environment (e.g. CMOS inverters) the algorithm operates in the time domain. It is implemented in a computer program called LISIM which yields high accuracy, good stability, and small computation time. Simulation results are given for on-chip line systems of medium size based on the slow-wave mode. All simulations shown here were run on a 12 Mflops computer. The required computation time was about 2.4-60 s depending on the size of the nonlinear circuit environment, the used features and the desired accuracy for the simulation.
AB - An algorithm for the computation of signal propagation in lossy interconnect systems at the chip as well as at the board level is presented. The algorithm allows us to handle effects like delay, dispersion, reflection, and electromagnetic coupling sufficiently. Especially for large systems of lines these effects cannot be treated by existing general purpose network analysis programs because of excessive computer runtime and numerical instabilities. To be able to handle line systems in a nonlinear circuit environment (e.g. CMOS inverters) the algorithm operates in the time domain. It is implemented in a computer program called LISIM which yields high accuracy, good stability, and small computation time. Simulation results are given for on-chip line systems of medium size based on the slow-wave mode. All simulations shown here were run on a 12 Mflops computer. The required computation time was about 2.4-60 s depending on the size of the nonlinear circuit environment, the used features and the desired accuracy for the simulation.
KW - electromagnetic coupling
KW - interconnect systems
KW - lossy line system
KW - signal propagation
KW - time domain simulation
UR - http://www.scopus.com/inward/record.url?scp=0024646529&partnerID=8YFLogxK
U2 - 10.1016/0167-9260(89)90058-8
DO - 10.1016/0167-9260(89)90058-8
M3 - Article
AN - SCOPUS:0024646529
VL - 7
SP - 35
EP - 48
JO - Integration, the VLSI Journal
JF - Integration, the VLSI Journal
SN - 0167-9260
IS - 1
ER -