Details
| Original language | English |
|---|---|
| Title of host publication | 49th ARFTG Conference Digest - Spring 1997 |
| Subtitle of host publication | Characterization of Broadband Telecommunications Components and Systems |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 223-226 |
| Number of pages | 4 |
| ISBN (electronic) | 0780356861, 9780780356863 |
| Publication status | Published - 1997 |
| Event | 49th ARFTG Conference Digest - Spring 1997 - Denver, United States Duration: 13 Jun 1997 → 13 Jun 1997 |
Publication series
| Name | 49th ARFTG Conference Digest - Spring 1997: Characterization of Broadband Telecommunications Components and Systems |
|---|
Abstract
A new method has been developed to determine the characteristic impedance matrix of a symmetric coupled lossy two line system on chips. The presented results are based on high frequency measurements of the scattering parameters. A comparison between the measured and analytical calculated results is given and shows excellent agreement.
ASJC Scopus subject areas
- Computer Science(all)
- Computer Networks and Communications
- Computer Science(all)
- Hardware and Architecture
- Engineering(all)
- Electrical and Electronic Engineering
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49th ARFTG Conference Digest - Spring 1997: Characterization of Broadband Telecommunications Components and Systems. Institute of Electrical and Electronics Engineers Inc., 1997. p. 223-226 4119917 (49th ARFTG Conference Digest - Spring 1997: Characterization of Broadband Telecommunications Components and Systems).
Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
}
TY - GEN
T1 - An Accurate Determination of the Characteristic Impedance Matrix of Coupled Symmetrical Lines on Chips Baser on High Frequency S-Parameter Measurements
AU - Winkel, Thomas Michael
AU - Dutta, Lohit Sagar
AU - Grabinski, Hartmut
PY - 1997
Y1 - 1997
N2 - A new method has been developed to determine the characteristic impedance matrix of a symmetric coupled lossy two line system on chips. The presented results are based on high frequency measurements of the scattering parameters. A comparison between the measured and analytical calculated results is given and shows excellent agreement.
AB - A new method has been developed to determine the characteristic impedance matrix of a symmetric coupled lossy two line system on chips. The presented results are based on high frequency measurements of the scattering parameters. A comparison between the measured and analytical calculated results is given and shows excellent agreement.
UR - http://www.scopus.com/inward/record.url?scp=78651296218&partnerID=8YFLogxK
U2 - 10.1109/ARFTG.1997.327232
DO - 10.1109/ARFTG.1997.327232
M3 - Conference contribution
AN - SCOPUS:78651296218
T3 - 49th ARFTG Conference Digest - Spring 1997: Characterization of Broadband Telecommunications Components and Systems
SP - 223
EP - 226
BT - 49th ARFTG Conference Digest - Spring 1997
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 49th ARFTG Conference Digest - Spring 1997
Y2 - 13 June 1997 through 13 June 1997
ER -