Details
| Original language | English |
|---|---|
| Title of host publication | 2015 12th International Conference on Electrical Engineering, Computing Science and Automatic Control, CCE 2015 |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| ISBN (electronic) | 9781467378390 |
| Publication status | Published - 17 Dec 2015 |
| Event | 2015 12th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE) - Mexico City, Mexico Duration: 28 Oct 2015 → 30 Oct 2015 |
Abstract
In this contribution, an algorithm is presented, which is able to extract the shortest linear edge and the longest diagonal of each single isolated human insulin crystal region, which is found in an arbitrary image captured by an insitu microscope inside of a reactor, where a human insulin crystallization processes is taking place. First, the image regions of the single isolated crystals are segmented by combining three different techniques: thresholding, single nearest prototype classification and snakes. Then, the image positions of the vertices of each single isolated crystal region are determined by using the Hough Transformation. Finally, both the shortest linear edge and the longest diagonal of each single isolated crystal region are extracted by measuring and comparing distances between the found image positions of the single isolated crystal region vertices. Experimental results revealed an absolute length error of 4.18 percent and 2.32 percent of the extracted shortest linear edges and the extracted longest diagonals, respectively.
ASJC Scopus subject areas
- Engineering(all)
- Electrical and Electronic Engineering
- Computer Science(all)
- Computer Science Applications
- Energy(all)
- Energy Engineering and Power Technology
- Engineering(all)
- Control and Systems Engineering
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2015 12th International Conference on Electrical Engineering, Computing Science and Automatic Control, CCE 2015. Institute of Electrical and Electronics Engineers Inc., 2015.
Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
}
TY - GEN
T1 - Algorithm to extract the shortest linear edge and the longest diagonal of single isolated human insulin crystals for in-situ microscopy
AU - Martinez, G.
AU - Lindner, P.
AU - Bluma, A.
AU - Scheper, T.
PY - 2015/12/17
Y1 - 2015/12/17
N2 - In this contribution, an algorithm is presented, which is able to extract the shortest linear edge and the longest diagonal of each single isolated human insulin crystal region, which is found in an arbitrary image captured by an insitu microscope inside of a reactor, where a human insulin crystallization processes is taking place. First, the image regions of the single isolated crystals are segmented by combining three different techniques: thresholding, single nearest prototype classification and snakes. Then, the image positions of the vertices of each single isolated crystal region are determined by using the Hough Transformation. Finally, both the shortest linear edge and the longest diagonal of each single isolated crystal region are extracted by measuring and comparing distances between the found image positions of the single isolated crystal region vertices. Experimental results revealed an absolute length error of 4.18 percent and 2.32 percent of the extracted shortest linear edges and the extracted longest diagonals, respectively.
AB - In this contribution, an algorithm is presented, which is able to extract the shortest linear edge and the longest diagonal of each single isolated human insulin crystal region, which is found in an arbitrary image captured by an insitu microscope inside of a reactor, where a human insulin crystallization processes is taking place. First, the image regions of the single isolated crystals are segmented by combining three different techniques: thresholding, single nearest prototype classification and snakes. Then, the image positions of the vertices of each single isolated crystal region are determined by using the Hough Transformation. Finally, both the shortest linear edge and the longest diagonal of each single isolated crystal region are extracted by measuring and comparing distances between the found image positions of the single isolated crystal region vertices. Experimental results revealed an absolute length error of 4.18 percent and 2.32 percent of the extracted shortest linear edges and the extracted longest diagonals, respectively.
UR - http://www.scopus.com/inward/record.url?scp=84962886866&partnerID=8YFLogxK
U2 - 10.1109/iceee.2015.7357903
DO - 10.1109/iceee.2015.7357903
M3 - Conference contribution
AN - SCOPUS:84962886866
BT - 2015 12th International Conference on Electrical Engineering, Computing Science and Automatic Control, CCE 2015
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2015 12th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE)
Y2 - 28 October 2015 through 30 October 2015
ER -