Details
| Original language | English |
|---|---|
| Title of host publication | ECCE 2016 |
| Subtitle of host publication | IEEE Energy Conversion Congress and Exposition, Proceedings |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| ISBN (electronic) | 9781509007370 |
| Publication status | Published - 2016 |
| Event | 2016 IEEE Energy Conversion Congress and Exposition, ECCE 2016 - Milwaukee, United States Duration: 18 Sept 2016 → 22 Sept 2016 |
Publication series
| Name | ECCE 2016 - IEEE Energy Conversion Congress and Exposition, Proceedings |
|---|
Abstract
This paper presents an FPGA-based on-line condition monitoring system integrated at gate-driver voltage level. The system uses the change of on-state voltage and thermal resistance as ageing indicators. The monitoring is realized by implementing an on-line semiconductor power loss measurement system for switching and on-state losses and a thermal model of the module. Apart from the concept, its practical implementation is described, and the experimental results are given.
ASJC Scopus subject areas
- Engineering(all)
- Control and Systems Engineering
- Engineering(all)
- Electrical and Electronic Engineering
- Energy(all)
- Energy Engineering and Power Technology
- Mathematics(all)
- Control and Optimization
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ECCE 2016 : IEEE Energy Conversion Congress and Exposition, Proceedings. Institute of Electrical and Electronics Engineers Inc., 2016. 7854828 (ECCE 2016 - IEEE Energy Conversion Congress and Exposition, Proceedings).
Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
}
TY - GEN
T1 - Advanced condition monitoring system based on on-line semiconductor loss measurements
AU - Krone, Tobias
AU - Dang Hung, Lan
AU - Jung, Marco
AU - Mertens, Axel
PY - 2016
Y1 - 2016
N2 - This paper presents an FPGA-based on-line condition monitoring system integrated at gate-driver voltage level. The system uses the change of on-state voltage and thermal resistance as ageing indicators. The monitoring is realized by implementing an on-line semiconductor power loss measurement system for switching and on-state losses and a thermal model of the module. Apart from the concept, its practical implementation is described, and the experimental results are given.
AB - This paper presents an FPGA-based on-line condition monitoring system integrated at gate-driver voltage level. The system uses the change of on-state voltage and thermal resistance as ageing indicators. The monitoring is realized by implementing an on-line semiconductor power loss measurement system for switching and on-state losses and a thermal model of the module. Apart from the concept, its practical implementation is described, and the experimental results are given.
UR - http://www.scopus.com/inward/record.url?scp=85015368542&partnerID=8YFLogxK
U2 - 10.1109/ECCE.2016.7854828
DO - 10.1109/ECCE.2016.7854828
M3 - Conference contribution
AN - SCOPUS:85015368542
T3 - ECCE 2016 - IEEE Energy Conversion Congress and Exposition, Proceedings
BT - ECCE 2016
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2016 IEEE Energy Conversion Congress and Exposition, ECCE 2016
Y2 - 18 September 2016 through 22 September 2016
ER -