Accurate determination of the characteristic impedance of lossy lines on chips based on high frequency S-parameter measurements

Research output: Contribution to conferencePaperResearchpeer review

Authors

  • Thomas Michael Winkel
  • Lohit Sagar Dutta
  • Hartmut Grabinski
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Details

Original languageEnglish
Pages190-195
Number of pages6
Publication statusPublished - 1996
Event1996 IEEE Multi-Chip Module Conference - Santa Cruz, United States
Duration: 6 Feb 19967 Feb 1996

Conference

Conference1996 IEEE Multi-Chip Module Conference
Country/TerritoryUnited States
CitySanta Cruz
Period6 Feb 19967 Feb 1996

Abstract

A very accurate, novel determination of the characteristic impedance of interconnects on semiconducting substrates has been developed. The method is based upon high frequency S-parameter measurements of two transmission lines of different lengths. The influence of the contact structures of the measurement probes are taken into account with the help of three additional measurements. The mathematical background of the method is presented. A comparison of the results obtained from measurements and from calculations is given and shows an excellent agreement.

ASJC Scopus subject areas

Cite this

Accurate determination of the characteristic impedance of lossy lines on chips based on high frequency S-parameter measurements. / Winkel, Thomas Michael; Dutta, Lohit Sagar; Grabinski, Hartmut.
1996. 190-195 Paper presented at 1996 IEEE Multi-Chip Module Conference, Santa Cruz, California, United States.

Research output: Contribution to conferencePaperResearchpeer review

Winkel, TM, Dutta, LS & Grabinski, H 1996, 'Accurate determination of the characteristic impedance of lossy lines on chips based on high frequency S-parameter measurements', Paper presented at 1996 IEEE Multi-Chip Module Conference, Santa Cruz, United States, 6 Feb 1996 - 7 Feb 1996 pp. 190-195. https://doi.org/10.1109/MCMC.1996.510793
Winkel, T. M., Dutta, L. S., & Grabinski, H. (1996). Accurate determination of the characteristic impedance of lossy lines on chips based on high frequency S-parameter measurements. 190-195. Paper presented at 1996 IEEE Multi-Chip Module Conference, Santa Cruz, California, United States. https://doi.org/10.1109/MCMC.1996.510793
Winkel TM, Dutta LS, Grabinski H. Accurate determination of the characteristic impedance of lossy lines on chips based on high frequency S-parameter measurements. 1996. Paper presented at 1996 IEEE Multi-Chip Module Conference, Santa Cruz, California, United States. doi: 10.1109/MCMC.1996.510793
Winkel, Thomas Michael ; Dutta, Lohit Sagar ; Grabinski, Hartmut. / Accurate determination of the characteristic impedance of lossy lines on chips based on high frequency S-parameter measurements. Paper presented at 1996 IEEE Multi-Chip Module Conference, Santa Cruz, California, United States.6 p.
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