Accurate Characterization of Fringing Effects at On-Chip Line Steps

Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

Authors

  • Thomas Michael Winkel
  • Lohit Sagar Dutta
  • Hartmut Grabinski

Research Organisations

External Research Organisations

  • IBM
View graph of relations

Details

Original languageEnglish
Title of host publication56th ARFTG Conference Digest
Subtitle of host publicationMetrology and Test for RF Telecommunications, ARFTG 2000
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (electronic)0780356861, 9780780356863
Publication statusPublished - 2000
Event56th ARFTG Conference Digest, ARFTG 2000 - Boulder, United States
Duration: 30 Nov 2000 → 1 Dec 2000

Publication series

Name56th ARFTG Conference Digest: Metrology and Test for RF Telecommunications, ARFTG 2000

Abstract

The electrical scattering field at steps on interconnects can be taken into account by a virtual additional line length of the wider line [1]. This effect must be taken into account when characterizing on and off-chip interconnects with discontinuities. The theory will be discussed and measurement results will be presented.

ASJC Scopus subject areas

Cite this

Accurate Characterization of Fringing Effects at On-Chip Line Steps. / Winkel, Thomas Michael; Dutta, Lohit Sagar; Grabinski, Hartmut.
56th ARFTG Conference Digest: Metrology and Test for RF Telecommunications, ARFTG 2000. Institute of Electrical and Electronics Engineers Inc., 2000. 4120144 (56th ARFTG Conference Digest: Metrology and Test for RF Telecommunications, ARFTG 2000).

Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

Winkel, TM, Dutta, LS & Grabinski, H 2000, Accurate Characterization of Fringing Effects at On-Chip Line Steps. in 56th ARFTG Conference Digest: Metrology and Test for RF Telecommunications, ARFTG 2000., 4120144, 56th ARFTG Conference Digest: Metrology and Test for RF Telecommunications, ARFTG 2000, Institute of Electrical and Electronics Engineers Inc., 56th ARFTG Conference Digest, ARFTG 2000, Boulder, United States, 30 Nov 2000. https://doi.org/10.1109/ARFTG.2000.327445
Winkel, T. M., Dutta, L. S., & Grabinski, H. (2000). Accurate Characterization of Fringing Effects at On-Chip Line Steps. In 56th ARFTG Conference Digest: Metrology and Test for RF Telecommunications, ARFTG 2000 Article 4120144 (56th ARFTG Conference Digest: Metrology and Test for RF Telecommunications, ARFTG 2000). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ARFTG.2000.327445
Winkel TM, Dutta LS, Grabinski H. Accurate Characterization of Fringing Effects at On-Chip Line Steps. In 56th ARFTG Conference Digest: Metrology and Test for RF Telecommunications, ARFTG 2000. Institute of Electrical and Electronics Engineers Inc. 2000. 4120144. (56th ARFTG Conference Digest: Metrology and Test for RF Telecommunications, ARFTG 2000). doi: 10.1109/ARFTG.2000.327445
Winkel, Thomas Michael ; Dutta, Lohit Sagar ; Grabinski, Hartmut. / Accurate Characterization of Fringing Effects at On-Chip Line Steps. 56th ARFTG Conference Digest: Metrology and Test for RF Telecommunications, ARFTG 2000. Institute of Electrical and Electronics Engineers Inc., 2000. (56th ARFTG Conference Digest: Metrology and Test for RF Telecommunications, ARFTG 2000).
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