Details
| Original language | English |
|---|---|
| Title of host publication | Laser-Induced Damage in Optical Materials: 2000 |
| Place of Publication | Bellingham |
| Publisher | SPIE |
| Pages | 62-73 |
| Number of pages | 12 |
| ISBN (print) | 0-8194-4036-1 |
| Publication status | Published - 12 Apr 2001 |
| Externally published | Yes |
Publication series
| Name | Proceedings of SPIE - The International Society for Optical Engineering |
|---|---|
| Publisher | SPIE |
| Volume | 4347 |
| ISSN (Print) | 0277-786X |
Abstract
An international round robin study was conducted on the absorption measurement of laser-quality coatings. Sets of optically coated samples were made by a "reactive DC magnetron" sputtering and an ion beam sputtering deposition process. The sample set included a high reflector at 514 nm and a high reflector for the near infrared (1030 to 1318 nm), single layers of silicon dioxide, tantalum pentoxide, and hafnium dioxide. For calibration purposes, a sample metalized with hafnium and an uncoated, superpolished fused silica substrate were also included. The set was sent to laboratory groups for absorptance measurement of these coatings. Whenever possible, each group was to measure a common, central area and another area specifically assigned to the respective group. Specific test protocols were also suggested in regards to the laser exposure time, power density, and surface preparation.
Keywords
- Absorptance, Argon ion lasers, Near-IR lasers, Optical coatings
ASJC Scopus subject areas
- Materials Science(all)
- Electronic, Optical and Magnetic Materials
- Physics and Astronomy(all)
- Condensed Matter Physics
- Computer Science(all)
- Computer Science Applications
- Mathematics(all)
- Applied Mathematics
- Engineering(all)
- Electrical and Electronic Engineering
Cite this
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- BibTeX
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Laser-Induced Damage in Optical Materials: 2000. Bellingham: SPIE, 2001. p. 62-73 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 4347).
Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
}
TY - GEN
T1 - Absorptance measurements of optical coatings
T2 - A round robin
AU - Chow, Robert
AU - Taylor, John R.
AU - Wu, Zhouling L.
AU - Boccara, Albert Claude
AU - Broulik, Ulrike
AU - Commandre, Mireille
AU - DiJon, Jean
AU - Fleig, Christoph
AU - Giesen, Adolf
AU - Fan, Zhengxiu
AU - Kuo, Pao-Kuang
AU - Lalezari, Ramin
AU - Moncur, Kent
AU - Obramski, H. J.
AU - Pellé, Catherine
AU - Reicher, David W.
AU - Ristau, Detlev
AU - Steiger, B.
AU - Thomsen, Marshall
AU - von Gunten, Marc K.
AU - Roche, Pierre J.
PY - 2001/4/12
Y1 - 2001/4/12
N2 - An international round robin study was conducted on the absorption measurement of laser-quality coatings. Sets of optically coated samples were made by a "reactive DC magnetron" sputtering and an ion beam sputtering deposition process. The sample set included a high reflector at 514 nm and a high reflector for the near infrared (1030 to 1318 nm), single layers of silicon dioxide, tantalum pentoxide, and hafnium dioxide. For calibration purposes, a sample metalized with hafnium and an uncoated, superpolished fused silica substrate were also included. The set was sent to laboratory groups for absorptance measurement of these coatings. Whenever possible, each group was to measure a common, central area and another area specifically assigned to the respective group. Specific test protocols were also suggested in regards to the laser exposure time, power density, and surface preparation.
AB - An international round robin study was conducted on the absorption measurement of laser-quality coatings. Sets of optically coated samples were made by a "reactive DC magnetron" sputtering and an ion beam sputtering deposition process. The sample set included a high reflector at 514 nm and a high reflector for the near infrared (1030 to 1318 nm), single layers of silicon dioxide, tantalum pentoxide, and hafnium dioxide. For calibration purposes, a sample metalized with hafnium and an uncoated, superpolished fused silica substrate were also included. The set was sent to laboratory groups for absorptance measurement of these coatings. Whenever possible, each group was to measure a common, central area and another area specifically assigned to the respective group. Specific test protocols were also suggested in regards to the laser exposure time, power density, and surface preparation.
KW - Absorptance
KW - Argon ion lasers
KW - Near-IR lasers
KW - Optical coatings
UR - http://www.scopus.com/inward/record.url?scp=0009547719&partnerID=8YFLogxK
U2 - 10.1117/12.425027
DO - 10.1117/12.425027
M3 - Conference contribution
AN - SCOPUS:0009547719
SN - 0-8194-4036-1
T3 - Proceedings of SPIE - The International Society for Optical Engineering
SP - 62
EP - 73
BT - Laser-Induced Damage in Optical Materials: 2000
PB - SPIE
CY - Bellingham
ER -