Details
| Original language | English |
|---|---|
| Pages (from-to) | 965-976 |
| Number of pages | 12 |
| Journal | International Journal of Thermophysics |
| Volume | 20 |
| Issue number | 3 |
| Publication status | Published - May 1999 |
| Externally published | Yes |
| Event | 1997 13th Symposium Thermophysical Properties in Honor of Ared Cezairliyan - Boulder, CO, USA Duration: 22 Jun 1997 → 27 Jun 1997 |
Abstract
Perspectives and limits of the application of the photothermal technique are given for the measurement of absorption, thermal, and thermoelastic properties in thin films. The peculiarities of this technique in the frequency and time domains are discussed in some detail, and selected important results with respect to laser damage studies in optical coatings are pointed out. Emphasis is placed on the absolute measurement of both optical and thermophysical properties in dielectric materials in thin-film form and, also, on the influence of both absorption and changed thermal properties in thin films on their thermally induced laser damage resistance.
ASJC Scopus subject areas
- Physics and Astronomy(all)
- Condensed Matter Physics
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In: International Journal of Thermophysics, Vol. 20, No. 3, 05.1999, p. 965-976.
Research output: Contribution to journal › Conference article › Research › peer review
}
TY - JOUR
T1 - Absolute measurement of thermophysical and optical thin-film properties by photothermal methods for the investigation of laser damage
AU - Welsch, Eberhard
AU - Ettrich, K.
AU - Ristau, D.
AU - Willamowski, Uwe
N1 - Funding information: E. Welsch and K. Ettrich acknowledge support by NATO Grant CRG 940652. K. Ettrich wishes to thank the Gottfried Daimler-und Carl Benz Stiftung for financial support. The support of the Bundesministerium fur Bildung, Wissenschaft, Forschung und Technologic (Contract 13EU0140/1, EUREKA-Projekt CHOCLAB) is gratefully acknowledged by D. Ristau and U. Willamowski.
PY - 1999/5
Y1 - 1999/5
N2 - Perspectives and limits of the application of the photothermal technique are given for the measurement of absorption, thermal, and thermoelastic properties in thin films. The peculiarities of this technique in the frequency and time domains are discussed in some detail, and selected important results with respect to laser damage studies in optical coatings are pointed out. Emphasis is placed on the absolute measurement of both optical and thermophysical properties in dielectric materials in thin-film form and, also, on the influence of both absorption and changed thermal properties in thin films on their thermally induced laser damage resistance.
AB - Perspectives and limits of the application of the photothermal technique are given for the measurement of absorption, thermal, and thermoelastic properties in thin films. The peculiarities of this technique in the frequency and time domains are discussed in some detail, and selected important results with respect to laser damage studies in optical coatings are pointed out. Emphasis is placed on the absolute measurement of both optical and thermophysical properties in dielectric materials in thin-film form and, also, on the influence of both absorption and changed thermal properties in thin films on their thermally induced laser damage resistance.
UR - http://www.scopus.com/inward/record.url?scp=0033131994&partnerID=8YFLogxK
U2 - 10.1023/A:1022603823628
DO - 10.1023/A:1022603823628
M3 - Conference article
AN - SCOPUS:0033131994
VL - 20
SP - 965
EP - 976
JO - International Journal of Thermophysics
JF - International Journal of Thermophysics
SN - 0195-928X
IS - 3
T2 - 1997 13th Symposium Thermophysical Properties in Honor of Ared Cezairliyan
Y2 - 22 June 1997 through 27 June 1997
ER -