Details
| Original language | English |
|---|---|
| Pages (from-to) | 1197-1202 |
| Number of pages | 6 |
| Journal | IEEE International Symposium on Electromagnetic Compatibility |
| Volume | 2 |
| Publication status | Published - 2001 |
| Event | 2001 International Symposium on Electromagnetic Compatibility - Montrealm, Que., Canada Duration: 13 Aug 2001 → 17 Aug 2001 |
Abstract
In this contribution a new modeling methodology for electromagnetic emissions of integrated circuits for system analysis is being presented. The developed models are based on a multipole expansion of the electromagnetic field. Using this macro-representation the number of necessary model parameters can be drastically reduced. In order to account also for the influence of external circuitry, the models have been appropriately extended towards a voltage controlled emission model. To show the applicability of the new approach a system-level simulator has been enhanced to use the developed models. The simulation results of a complex configuration are compared to reference calculations. Additionally the high efficiency of this approach concerning computation time and memory consumption is being described.
ASJC Scopus subject areas
- Physics and Astronomy(all)
- Condensed Matter Physics
- Engineering(all)
- Electrical and Electronic Engineering
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In: IEEE International Symposium on Electromagnetic Compatibility, Vol. 2, 2001, p. 1197-1202.
Research output: Contribution to journal › Conference article › Research › peer review
}
TY - JOUR
T1 - A voltage controlled emission model of electromagnetic emission of IC for system analysis
AU - Kralicek, P.
AU - John, W.
AU - De Smedt, R.
AU - Vervoort, K.
AU - Garbe, H.
PY - 2001
Y1 - 2001
N2 - In this contribution a new modeling methodology for electromagnetic emissions of integrated circuits for system analysis is being presented. The developed models are based on a multipole expansion of the electromagnetic field. Using this macro-representation the number of necessary model parameters can be drastically reduced. In order to account also for the influence of external circuitry, the models have been appropriately extended towards a voltage controlled emission model. To show the applicability of the new approach a system-level simulator has been enhanced to use the developed models. The simulation results of a complex configuration are compared to reference calculations. Additionally the high efficiency of this approach concerning computation time and memory consumption is being described.
AB - In this contribution a new modeling methodology for electromagnetic emissions of integrated circuits for system analysis is being presented. The developed models are based on a multipole expansion of the electromagnetic field. Using this macro-representation the number of necessary model parameters can be drastically reduced. In order to account also for the influence of external circuitry, the models have been appropriately extended towards a voltage controlled emission model. To show the applicability of the new approach a system-level simulator has been enhanced to use the developed models. The simulation results of a complex configuration are compared to reference calculations. Additionally the high efficiency of this approach concerning computation time and memory consumption is being described.
UR - http://www.scopus.com/inward/record.url?scp=0035786078&partnerID=8YFLogxK
M3 - Conference article
AN - SCOPUS:0035786078
VL - 2
SP - 1197
EP - 1202
JO - IEEE International Symposium on Electromagnetic Compatibility
JF - IEEE International Symposium on Electromagnetic Compatibility
SN - 0190-1494
T2 - 2001 International Symposium on Electromagnetic Compatibility
Y2 - 13 August 2001 through 17 August 2001
ER -