Details
| Original language | English |
|---|---|
| Article number | 285 |
| Journal | Nature Communications |
| Volume | 12 |
| Issue number | 1 |
| Publication status | Published - 12 Jan 2021 |
| Externally published | Yes |
Abstract
Mesoscopic integrated circuits aim for precise control over elementary quantum systems. However, as fidelities improve, the increasingly rare errors and component crosstalk pose a challenge for validating error models and quantifying accuracy of circuit performance. Here we propose and implement a circuit-level benchmark that models fidelity as a random walk of an error syndrome, detected by an accumulating probe. Additionally, contributions of correlated noise, induced environmentally or by memory, are revealed as limits of achievable fidelity by statistical consistency analysis of the full distribution of error counts. Applying this methodology to a high-fidelity implementation of on-demand transfer of electrons in quantum dots we are able to utilize the high precision of charge counting to robustly estimate the error rate of the full circuit and its variability due to noise in the environment. As the clock frequency of the circuit is increased, the random walk reveals a memory effect. This benchmark contributes towards a rigorous metrology of quantum circuits.
ASJC Scopus subject areas
- Chemistry(all)
- General Chemistry
- Biochemistry, Genetics and Molecular Biology(all)
- General Biochemistry,Genetics and Molecular Biology
- Physics and Astronomy(all)
- General Physics and Astronomy
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In: Nature Communications, Vol. 12, No. 1, 285, 12.01.2021.
Research output: Contribution to journal › Article › Research › peer review
}
TY - JOUR
T1 - A random-walk benchmark for single-electron circuits
AU - Reifert, David
AU - Kokainis, Martins
AU - Ambainis, Andris
AU - Kashcheyevs, Vyacheslavs
AU - Ubbelohde, Niels
N1 - Funding information: We acknowledge T. Gerster, L. Freise, H. Marx, K. Pierz, and T. Weimann for support in device fabrication, J. Valeinis for discussions. D.R. additionally acknowledges funding by the Deutsche Forschungsgemeinschaft (DFG) under Germany’s Excellence Strategy— EXC-2123 —90837967, as well as the support of the Braunschweig International Graduate School of Metrology B-IGSM. M.K., A.A., and V.K are supported by Latvian Council of Science (grant no. lzp-2018/1-0173). A.A. also acknowledges support by ‘Quantum algorithms: from complexity theory to experiment’ funded under ERDF program 1.1.1.5. Open Access funding enabled and organized by Projekt DEAL.
PY - 2021/1/12
Y1 - 2021/1/12
N2 - Mesoscopic integrated circuits aim for precise control over elementary quantum systems. However, as fidelities improve, the increasingly rare errors and component crosstalk pose a challenge for validating error models and quantifying accuracy of circuit performance. Here we propose and implement a circuit-level benchmark that models fidelity as a random walk of an error syndrome, detected by an accumulating probe. Additionally, contributions of correlated noise, induced environmentally or by memory, are revealed as limits of achievable fidelity by statistical consistency analysis of the full distribution of error counts. Applying this methodology to a high-fidelity implementation of on-demand transfer of electrons in quantum dots we are able to utilize the high precision of charge counting to robustly estimate the error rate of the full circuit and its variability due to noise in the environment. As the clock frequency of the circuit is increased, the random walk reveals a memory effect. This benchmark contributes towards a rigorous metrology of quantum circuits.
AB - Mesoscopic integrated circuits aim for precise control over elementary quantum systems. However, as fidelities improve, the increasingly rare errors and component crosstalk pose a challenge for validating error models and quantifying accuracy of circuit performance. Here we propose and implement a circuit-level benchmark that models fidelity as a random walk of an error syndrome, detected by an accumulating probe. Additionally, contributions of correlated noise, induced environmentally or by memory, are revealed as limits of achievable fidelity by statistical consistency analysis of the full distribution of error counts. Applying this methodology to a high-fidelity implementation of on-demand transfer of electrons in quantum dots we are able to utilize the high precision of charge counting to robustly estimate the error rate of the full circuit and its variability due to noise in the environment. As the clock frequency of the circuit is increased, the random walk reveals a memory effect. This benchmark contributes towards a rigorous metrology of quantum circuits.
UR - http://www.scopus.com/inward/record.url?scp=85099228707&partnerID=8YFLogxK
U2 - 10.1038/s41467-020-20554-w
DO - 10.1038/s41467-020-20554-w
M3 - Article
C2 - 33436588
AN - SCOPUS:85099228707
VL - 12
JO - Nature Communications
JF - Nature Communications
SN - 2041-1723
IS - 1
M1 - 285
ER -