Details
| Original language | English |
|---|---|
| Pages (from-to) | 454-465 |
| Number of pages | 12 |
| Journal | Nonlinearity |
| Volume | 30 |
| Issue number | 2 |
| Publication status | Published - 20 Dec 2016 |
Abstract
Numerical evidence is provided that there are non-constant permittivity profiles which force solutions to a two-dimensional coupled moving boundary problem modelling microelectromechanical systems to be positive, while the corresponding small-aspect ratio model produces solutions which are always non-positive.
Keywords
- free boundary value problem, general permittivity profile, MEMS, small-aspect ratio limit
ASJC Scopus subject areas
- Physics and Astronomy(all)
- Statistical and Nonlinear Physics
- Mathematics(all)
- Mathematical Physics
- Physics and Astronomy(all)
- Mathematics(all)
- Applied Mathematics
Cite this
- Standard
- Harvard
- Apa
- Vancouver
- BibTeX
- RIS
In: Nonlinearity, Vol. 30, No. 2, 20.12.2016, p. 454-465.
Research output: Contribution to journal › Article › Research › peer review
}
TY - JOUR
T1 - A note on model reduction for microelectromechanical systems
AU - Escher, Joachim
AU - Gosselet, Pierre
AU - Lienstromberg, Christina
N1 - Funding information: The authors are grateful to G Starke for fruitful discussions on the implementation of the numerical scheme. Furthermore, discussions on various topics on MEMS with P Laurenot and C Walker are acknowledged by JE. Moreover, the authors are thankful to the referees and the editors of Nonlinearity for their helpful remarks and suggestions. Finally, this research project has been financially supported by the DFG IRTG 1627.
PY - 2016/12/20
Y1 - 2016/12/20
N2 - Numerical evidence is provided that there are non-constant permittivity profiles which force solutions to a two-dimensional coupled moving boundary problem modelling microelectromechanical systems to be positive, while the corresponding small-aspect ratio model produces solutions which are always non-positive.
AB - Numerical evidence is provided that there are non-constant permittivity profiles which force solutions to a two-dimensional coupled moving boundary problem modelling microelectromechanical systems to be positive, while the corresponding small-aspect ratio model produces solutions which are always non-positive.
KW - free boundary value problem
KW - general permittivity profile
KW - MEMS
KW - small-aspect ratio limit
UR - http://www.scopus.com/inward/record.url?scp=85011394747&partnerID=8YFLogxK
U2 - 10.1088/1361-6544/aa4ff9
DO - 10.1088/1361-6544/aa4ff9
M3 - Article
AN - SCOPUS:85011394747
VL - 30
SP - 454
EP - 465
JO - Nonlinearity
JF - Nonlinearity
SN - 0951-7715
IS - 2
ER -