A Marked Point Process for Modeling Lidar Waveforms

Research output: Contribution to journalArticleResearchpeer review

Authors

  • Clment Mallet
  • Florent Lafarge
  • Michel Roux
  • Uwe Soergel
  • Frédéric Bretar
  • Christian Heipke

External Research Organisations

  • Université Paris-Est Créteil Val-de-Marne (UPEC)
  • INRIA Institut National de Recherche en Informatique et en Automatique
  • Télécom ParisTech
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Details

Original languageEnglish
Article number5518410
Pages (from-to)3204-3221
Number of pages18
JournalIEEE Transactions on Image Processing
Volume19
Issue number12
Publication statusPublished - 14 Jun 2010

Abstract

Lidar waveforms are 1-D signals representing a train of echoes caused by reflections at different targets. Modeling these echoes with the appropriate parametric function is useful to retrieve information about the physical characteristics of the targets. This paper presents a new probabilistic model based upon a marked point process which reconstructs the echoes from recorded discrete waveforms as a sequence of parametric curves. Such an approach allows to fit each mode of a waveform with the most suitable function and to deal with both, symmetric and asymmetric, echoes. The model takes into account a data term, which measures the coherence between the models and the waveforms, and a regularization term, which introduces prior knowledge on the reconstructed signal. The exploration of the associated configuration space is performed by a reversible jump Markov chain Monte Carlo (RJMCMC) sampler coupled with simulated annealing. Experiments with different kinds of lidar signals, especially from urban scenes, show the high potential of the proposed approach. To further demonstrate the advantages of the suggested method, actual laser scans are classified and the results are reported.

Keywords

    Lidar, marked point process, Monte Carlo sampling, object-based stochastic model, source modeling

ASJC Scopus subject areas

Cite this

A Marked Point Process for Modeling Lidar Waveforms. / Mallet, Clment; Lafarge, Florent; Roux, Michel et al.
In: IEEE Transactions on Image Processing, Vol. 19, No. 12, 5518410, 14.06.2010, p. 3204-3221.

Research output: Contribution to journalArticleResearchpeer review

Mallet, C, Lafarge, F, Roux, M, Soergel, U, Bretar, F & Heipke, C 2010, 'A Marked Point Process for Modeling Lidar Waveforms', IEEE Transactions on Image Processing, vol. 19, no. 12, 5518410, pp. 3204-3221. https://doi.org/10.1109/TIP.2010.2052825
Mallet, C., Lafarge, F., Roux, M., Soergel, U., Bretar, F., & Heipke, C. (2010). A Marked Point Process for Modeling Lidar Waveforms. IEEE Transactions on Image Processing, 19(12), 3204-3221. Article 5518410. https://doi.org/10.1109/TIP.2010.2052825
Mallet C, Lafarge F, Roux M, Soergel U, Bretar F, Heipke C. A Marked Point Process for Modeling Lidar Waveforms. IEEE Transactions on Image Processing. 2010 Jun 14;19(12):3204-3221. 5518410. doi: 10.1109/TIP.2010.2052825
Mallet, Clment ; Lafarge, Florent ; Roux, Michel et al. / A Marked Point Process for Modeling Lidar Waveforms. In: IEEE Transactions on Image Processing. 2010 ; Vol. 19, No. 12. pp. 3204-3221.
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