A Fuzzy Approach for IEMI Risk Analysis of IT-Systems with Respect to Transient Disturbances

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Authors

  • Tim Peikert
  • Heyno Garbe
  • Stefan Potthast

External Research Organisations

  • Wehrwissenschaftliches Institut für Schutztechnologien ABC -Schutz (WIS)
View graph of relations

Details

Original languageEnglish
Title of host publication2015 IEEE International Symposium on Electromagnetic Compatibility
Subtitle of host publicationEMC
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1077-1082
Number of pages6
ISBN (electronic)9781479966158
Publication statusPublished - 2015
EventIEEE International Symposium on Electromagnetic Compatibility, EMC 2015 - Dresden, Germany
Duration: 16 Aug 201522 Aug 2015

Publication series

NameIEEE International Symposium on Electromagnetic Compatibility
Volume2015-Septmber
ISSN (Print)1077-4076
ISSN (electronic)2158-1118

Abstract

This paper introduces a procedural method for the systematic risk analysis when an IT-System is exposed to an intentional electromagnetic environment (IEME). The method analyzes the susceptibility of an electronic system with the respect to intentional electromagnetic interferences (IEMI). It combines the advantage of fault tree analysis (FTA), electromagnetic topology (EMT) and Bayesian networks (BN) and enhance the statistical-based models for the coupling and the system behavior with uncertain data. The fuzzy approach in this paper adds to the statistical and crisp data, the uncertainness with linguistic terms. That terms treat the predication for that crisp data not exist or only reach with the utmost effort. In a final step the critical scenario are identify and the elements which contribute most to the risk.

Keywords

    decision making under risk, Electromagnetic (EM) effects, fuzzy events, fuzzy probabilities, intentional electromagnetic interference (IEMI), probabilistic risk analysis

ASJC Scopus subject areas

Cite this

A Fuzzy Approach for IEMI Risk Analysis of IT-Systems with Respect to Transient Disturbances. / Peikert, Tim; Garbe, Heyno; Potthast, Stefan.
2015 IEEE International Symposium on Electromagnetic Compatibility: EMC. Institute of Electrical and Electronics Engineers Inc., 2015. p. 1077-1082 7256318 (IEEE International Symposium on Electromagnetic Compatibility; Vol. 2015-Septmber).

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Peikert, T, Garbe, H & Potthast, S 2015, A Fuzzy Approach for IEMI Risk Analysis of IT-Systems with Respect to Transient Disturbances. in 2015 IEEE International Symposium on Electromagnetic Compatibility: EMC., 7256318, IEEE International Symposium on Electromagnetic Compatibility, vol. 2015-Septmber, Institute of Electrical and Electronics Engineers Inc., pp. 1077-1082, IEEE International Symposium on Electromagnetic Compatibility, EMC 2015, Dresden, Germany, 16 Aug 2015. https://doi.org/10.1109/ISEMC.2015.7256318
Peikert, T., Garbe, H., & Potthast, S. (2015). A Fuzzy Approach for IEMI Risk Analysis of IT-Systems with Respect to Transient Disturbances. In 2015 IEEE International Symposium on Electromagnetic Compatibility: EMC (pp. 1077-1082). Article 7256318 (IEEE International Symposium on Electromagnetic Compatibility; Vol. 2015-Septmber). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISEMC.2015.7256318
Peikert T, Garbe H, Potthast S. A Fuzzy Approach for IEMI Risk Analysis of IT-Systems with Respect to Transient Disturbances. In 2015 IEEE International Symposium on Electromagnetic Compatibility: EMC. Institute of Electrical and Electronics Engineers Inc. 2015. p. 1077-1082. 7256318. (IEEE International Symposium on Electromagnetic Compatibility). doi: 10.1109/ISEMC.2015.7256318
Peikert, Tim ; Garbe, Heyno ; Potthast, Stefan. / A Fuzzy Approach for IEMI Risk Analysis of IT-Systems with Respect to Transient Disturbances. 2015 IEEE International Symposium on Electromagnetic Compatibility: EMC. Institute of Electrical and Electronics Engineers Inc., 2015. pp. 1077-1082 (IEEE International Symposium on Electromagnetic Compatibility).
Download
@inproceedings{2947d331565a445ead4254ecb0d4099d,
title = "A Fuzzy Approach for IEMI Risk Analysis of IT-Systems with Respect to Transient Disturbances",
abstract = "This paper introduces a procedural method for the systematic risk analysis when an IT-System is exposed to an intentional electromagnetic environment (IEME). The method analyzes the susceptibility of an electronic system with the respect to intentional electromagnetic interferences (IEMI). It combines the advantage of fault tree analysis (FTA), electromagnetic topology (EMT) and Bayesian networks (BN) and enhance the statistical-based models for the coupling and the system behavior with uncertain data. The fuzzy approach in this paper adds to the statistical and crisp data, the uncertainness with linguistic terms. That terms treat the predication for that crisp data not exist or only reach with the utmost effort. In a final step the critical scenario are identify and the elements which contribute most to the risk.",
keywords = "decision making under risk, Electromagnetic (EM) effects, fuzzy events, fuzzy probabilities, intentional electromagnetic interference (IEMI), probabilistic risk analysis",
author = "Tim Peikert and Heyno Garbe and Stefan Potthast",
year = "2015",
doi = "10.1109/ISEMC.2015.7256318",
language = "English",
series = "IEEE International Symposium on Electromagnetic Compatibility",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "1077--1082",
booktitle = "2015 IEEE International Symposium on Electromagnetic Compatibility",
address = "United States",
note = "IEEE International Symposium on Electromagnetic Compatibility, EMC 2015 ; Conference date: 16-08-2015 Through 22-08-2015",

}

Download

TY - GEN

T1 - A Fuzzy Approach for IEMI Risk Analysis of IT-Systems with Respect to Transient Disturbances

AU - Peikert, Tim

AU - Garbe, Heyno

AU - Potthast, Stefan

PY - 2015

Y1 - 2015

N2 - This paper introduces a procedural method for the systematic risk analysis when an IT-System is exposed to an intentional electromagnetic environment (IEME). The method analyzes the susceptibility of an electronic system with the respect to intentional electromagnetic interferences (IEMI). It combines the advantage of fault tree analysis (FTA), electromagnetic topology (EMT) and Bayesian networks (BN) and enhance the statistical-based models for the coupling and the system behavior with uncertain data. The fuzzy approach in this paper adds to the statistical and crisp data, the uncertainness with linguistic terms. That terms treat the predication for that crisp data not exist or only reach with the utmost effort. In a final step the critical scenario are identify and the elements which contribute most to the risk.

AB - This paper introduces a procedural method for the systematic risk analysis when an IT-System is exposed to an intentional electromagnetic environment (IEME). The method analyzes the susceptibility of an electronic system with the respect to intentional electromagnetic interferences (IEMI). It combines the advantage of fault tree analysis (FTA), electromagnetic topology (EMT) and Bayesian networks (BN) and enhance the statistical-based models for the coupling and the system behavior with uncertain data. The fuzzy approach in this paper adds to the statistical and crisp data, the uncertainness with linguistic terms. That terms treat the predication for that crisp data not exist or only reach with the utmost effort. In a final step the critical scenario are identify and the elements which contribute most to the risk.

KW - decision making under risk

KW - Electromagnetic (EM) effects

KW - fuzzy events

KW - fuzzy probabilities

KW - intentional electromagnetic interference (IEMI)

KW - probabilistic risk analysis

UR - http://www.scopus.com/inward/record.url?scp=84953848949&partnerID=8YFLogxK

U2 - 10.1109/ISEMC.2015.7256318

DO - 10.1109/ISEMC.2015.7256318

M3 - Conference contribution

AN - SCOPUS:84953848949

T3 - IEEE International Symposium on Electromagnetic Compatibility

SP - 1077

EP - 1082

BT - 2015 IEEE International Symposium on Electromagnetic Compatibility

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - IEEE International Symposium on Electromagnetic Compatibility, EMC 2015

Y2 - 16 August 2015 through 22 August 2015

ER -