A fast and accurate Monte Carlo method for interconnect variation

Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

Authors

  • M. Zhang
  • M. Olbrich
  • H. Kinzelbach
  • D. Seider
  • E. Barke

Research Organisations

External Research Organisations

  • Infineon Technologies AG
View graph of relations

Details

Original languageEnglish
Title of host publication2006 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT'06
PublisherIEEE Computer Society
ISBN (print)1424400988, 9781424400980
Publication statusPublished - 2006
Event Integrated Circuit Design and Technology, 2006. ICICDT '06. 2006 IEEE International Conference - Padova, Italy
Duration: 24 May 2006 → 26 May 2006

Abstract

For exploring the impact of manufacturing variation on interconnect characteristics, the basic Monte Carlo Method is accurate but computationally very expensive. To overcome the inherent speed limitation we developed an uncomplicated method employing the Importance Sampling technique. Using Confidence Intervals our results always take uncertainty into account. The application to a two dimensional interconnect model shows that our method is 23-93 times faster than the basic Monte Carlo Method.

ASJC Scopus subject areas

Cite this

A fast and accurate Monte Carlo method for interconnect variation. / Zhang, M.; Olbrich, M.; Kinzelbach, H. et al.
2006 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT'06. IEEE Computer Society, 2006. 1669415.

Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

Zhang, M, Olbrich, M, Kinzelbach, H, Seider, D & Barke, E 2006, A fast and accurate Monte Carlo method for interconnect variation. in 2006 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT'06., 1669415, IEEE Computer Society, Integrated Circuit Design and Technology, 2006. ICICDT '06. 2006 IEEE International Conference, Padova, Italy, 24 May 2006. https://doi.org/10.1109/icicdt.2006.220828
Zhang, M., Olbrich, M., Kinzelbach, H., Seider, D., & Barke, E. (2006). A fast and accurate Monte Carlo method for interconnect variation. In 2006 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT'06 Article 1669415 IEEE Computer Society. https://doi.org/10.1109/icicdt.2006.220828
Zhang M, Olbrich M, Kinzelbach H, Seider D, Barke E. A fast and accurate Monte Carlo method for interconnect variation. In 2006 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT'06. IEEE Computer Society. 2006. 1669415 doi: 10.1109/icicdt.2006.220828
Zhang, M. ; Olbrich, M. ; Kinzelbach, H. et al. / A fast and accurate Monte Carlo method for interconnect variation. 2006 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT'06. IEEE Computer Society, 2006.
Download
@inproceedings{efc9f57d283640999dc7e3dad4e50846,
title = "A fast and accurate Monte Carlo method for interconnect variation",
abstract = "For exploring the impact of manufacturing variation on interconnect characteristics, the basic Monte Carlo Method is accurate but computationally very expensive. To overcome the inherent speed limitation we developed an uncomplicated method employing the Importance Sampling technique. Using Confidence Intervals our results always take uncertainty into account. The application to a two dimensional interconnect model shows that our method is 23-93 times faster than the basic Monte Carlo Method.",
author = "M. Zhang and M. Olbrich and H. Kinzelbach and D. Seider and E. Barke",
year = "2006",
doi = "10.1109/icicdt.2006.220828",
language = "English",
isbn = "1424400988",
booktitle = "2006 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT'06",
publisher = "IEEE Computer Society",
address = "United States",
note = " Integrated Circuit Design and Technology, 2006. ICICDT '06. 2006 IEEE International Conference ; Conference date: 24-05-2006 Through 26-05-2006",

}

Download

TY - GEN

T1 - A fast and accurate Monte Carlo method for interconnect variation

AU - Zhang, M.

AU - Olbrich, M.

AU - Kinzelbach, H.

AU - Seider, D.

AU - Barke, E.

PY - 2006

Y1 - 2006

N2 - For exploring the impact of manufacturing variation on interconnect characteristics, the basic Monte Carlo Method is accurate but computationally very expensive. To overcome the inherent speed limitation we developed an uncomplicated method employing the Importance Sampling technique. Using Confidence Intervals our results always take uncertainty into account. The application to a two dimensional interconnect model shows that our method is 23-93 times faster than the basic Monte Carlo Method.

AB - For exploring the impact of manufacturing variation on interconnect characteristics, the basic Monte Carlo Method is accurate but computationally very expensive. To overcome the inherent speed limitation we developed an uncomplicated method employing the Importance Sampling technique. Using Confidence Intervals our results always take uncertainty into account. The application to a two dimensional interconnect model shows that our method is 23-93 times faster than the basic Monte Carlo Method.

UR - http://www.scopus.com/inward/record.url?scp=42749108140&partnerID=8YFLogxK

U2 - 10.1109/icicdt.2006.220828

DO - 10.1109/icicdt.2006.220828

M3 - Conference contribution

AN - SCOPUS:42749108140

SN - 1424400988

SN - 9781424400980

BT - 2006 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT'06

PB - IEEE Computer Society

T2 - Integrated Circuit Design and Technology, 2006. ICICDT '06. 2006 IEEE International Conference

Y2 - 24 May 2006 through 26 May 2006

ER -