9 ms carrier lifetime in kerfless epitaxial wafers by n-type POLO gettering

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Authors

  • Catherin Gemmel
  • Jan Hensen
  • Nils Folchert
  • Felix Haase
  • Robby Peibst
  • Sarah Kajari-Schröder
  • Rolf Brendel

External Research Organisations

  • Institute for Solar Energy Research (ISFH)
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Details

Original languageEnglish
Title of host publicationSiliconPV 2018, the 8th International Conference on Crystalline Silicon Photovoltaics
Publication statusPublished - 10 Aug 2018
EventSiliconPV 2018: The 8th International Conference on Crystalline Silicon Photovoltaics - Lausanne, Switzerland
Duration: 19 Mar 201821 Mar 2018

Publication series

NameAIP Conference Proceedings
Volume1999
ISSN (Print)0094-243X
ISSN (electronic)1551-7616

Abstract

The bulk lifetime of epitaxially grown silicon wafers increases significantly after phosphorous diffusion gettering. A strong diffusion is advantageous for gettering but is not ideal for highest solar cell efficiencies. We find that gettering with an n-type polycrystalline silicon on oxide (POLO) junction increases the bulk lifetime of epitaxial wafers from originally 2.3 to 4.3 ms to finally up to 8 ms at an injection level Δp = 1015 cm-3. This lifetime increase as large as for phosphorous-diffusion gettering. However, POLO junctions have a superior surface passivation when compared to diffused junctions. This offers a novel gettering process that not only increase the charge carrier lifetime of epitaxial wafers but can also be effectively integrated into a solar cell processes employing POLO junctions.

ASJC Scopus subject areas

Cite this

9 ms carrier lifetime in kerfless epitaxial wafers by n-type POLO gettering. / Gemmel, Catherin; Hensen, Jan; Folchert, Nils et al.
SiliconPV 2018, the 8th International Conference on Crystalline Silicon Photovoltaics. 2018. 130005 (AIP Conference Proceedings; Vol. 1999).

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Gemmel, C, Hensen, J, Folchert, N, Haase, F, Peibst, R, Kajari-Schröder, S & Brendel, R 2018, 9 ms carrier lifetime in kerfless epitaxial wafers by n-type POLO gettering. in SiliconPV 2018, the 8th International Conference on Crystalline Silicon Photovoltaics., 130005, AIP Conference Proceedings, vol. 1999, SiliconPV 2018: The 8th International Conference on Crystalline Silicon Photovoltaics, Lausanne, Switzerland, 19 Mar 2018. https://doi.org/10.1063/1.5049324
Gemmel, C., Hensen, J., Folchert, N., Haase, F., Peibst, R., Kajari-Schröder, S., & Brendel, R. (2018). 9 ms carrier lifetime in kerfless epitaxial wafers by n-type POLO gettering. In SiliconPV 2018, the 8th International Conference on Crystalline Silicon Photovoltaics Article 130005 (AIP Conference Proceedings; Vol. 1999). https://doi.org/10.1063/1.5049324
Gemmel C, Hensen J, Folchert N, Haase F, Peibst R, Kajari-Schröder S et al. 9 ms carrier lifetime in kerfless epitaxial wafers by n-type POLO gettering. In SiliconPV 2018, the 8th International Conference on Crystalline Silicon Photovoltaics. 2018. 130005. (AIP Conference Proceedings). doi: 10.1063/1.5049324
Gemmel, Catherin ; Hensen, Jan ; Folchert, Nils et al. / 9 ms carrier lifetime in kerfless epitaxial wafers by n-type POLO gettering. SiliconPV 2018, the 8th International Conference on Crystalline Silicon Photovoltaics. 2018. (AIP Conference Proceedings).
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abstract = "The bulk lifetime of epitaxially grown silicon wafers increases significantly after phosphorous diffusion gettering. A strong diffusion is advantageous for gettering but is not ideal for highest solar cell efficiencies. We find that gettering with an n-type polycrystalline silicon on oxide (POLO) junction increases the bulk lifetime of epitaxial wafers from originally 2.3 to 4.3 ms to finally up to 8 ms at an injection level Δp = 1015 cm-3. This lifetime increase as large as for phosphorous-diffusion gettering. However, POLO junctions have a superior surface passivation when compared to diffused junctions. This offers a novel gettering process that not only increase the charge carrier lifetime of epitaxial wafers but can also be effectively integrated into a solar cell processes employing POLO junctions.",
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