3-dimensional simulations of temperature and current density distribution in a via structure

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Original languageEnglish
Title of host publicationAnnual Proceedings - Reliability Physics (Symposium)
Pages361-365
Number of pages5
Publication statusPublished - 1992
Event30th Annual International Reliability Physics Symposium - San Diego, CA, USA
Duration: 31 Mar 19922 Apr 1992

Publication series

NameAnnual Proceedings - Reliability Physics (Symposium)
ISSN (Print)0099-9512

Abstract

The influence of geometry (overlap, step coverage, filling ratio) and filling material on temperature and current density distributions in via structures of different forms and technologies simulated with the finite element method program ANSYS was studied. Vias of square, circular, and oval forms were investigated. The influence of via filling was observed. Reduction of current crowding and self-heating effects were found for the tungsten-filled via. Critical parameters for the filling materials were determined. Local temperature and current density distributions are shown.

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3-dimensional simulations of temperature and current density distribution in a via structure. / Weide, K.; Hasse, W.
Annual Proceedings - Reliability Physics (Symposium). 1992. p. 361-365 (Annual Proceedings - Reliability Physics (Symposium)).

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Weide, K & Hasse, W 1992, 3-dimensional simulations of temperature and current density distribution in a via structure. in Annual Proceedings - Reliability Physics (Symposium). Annual Proceedings - Reliability Physics (Symposium), pp. 361-365, 30th Annual International Reliability Physics Symposium, San Diego, CA, USA, 31 Mar 1992. https://doi.org/10.1109/relphy.1992.187670
Weide, K., & Hasse, W. (1992). 3-dimensional simulations of temperature and current density distribution in a via structure. In Annual Proceedings - Reliability Physics (Symposium) (pp. 361-365). (Annual Proceedings - Reliability Physics (Symposium)). https://doi.org/10.1109/relphy.1992.187670
Weide K, Hasse W. 3-dimensional simulations of temperature and current density distribution in a via structure. In Annual Proceedings - Reliability Physics (Symposium). 1992. p. 361-365. (Annual Proceedings - Reliability Physics (Symposium)). doi: 10.1109/relphy.1992.187670
Weide, K. ; Hasse, W. / 3-dimensional simulations of temperature and current density distribution in a via structure. Annual Proceedings - Reliability Physics (Symposium). 1992. pp. 361-365 (Annual Proceedings - Reliability Physics (Symposium)).
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