3-D time-depending electro- and thermomigration simulation of metallization structures

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Original languageEnglish
Pages (from-to)477-481
Number of pages5
JournalAdvanced Metallization Conference (AMC)
Publication statusPublished - 2000
EventAdvanced Metallization Conference 2000 - San Diego, CA, United States
Duration: 2 Oct 20004 Oct 2000

Abstract

For reliability prediction in metallization structures the different migration mechanisms caused by high loading conditions become more and more important. With numerical methods like the finite element method (FEM), it is possible to determine the weakest part of the structure. This paper presents a new method for time dependent 3-dimensional degradation simulations of metallization structures stressed by high current densities. The FE-method offers the possibility to predict the progress of the degradation, and to estimate the reliability by calculating the corresponding Time To Failure (TTF) value. The simulation results are in good agreement with SEM observations and measurements.

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3-D time-depending electro- and thermomigration simulation of metallization structures. / Dalleau, D.; Weide-Zaage, K.
In: Advanced Metallization Conference (AMC), 2000, p. 477-481.

Research output: Contribution to journalConference articleResearchpeer review

Dalleau, D & Weide-Zaage, K 2000, '3-D time-depending electro- and thermomigration simulation of metallization structures', Advanced Metallization Conference (AMC), pp. 477-481.
Dalleau, D., & Weide-Zaage, K. (2000). 3-D time-depending electro- and thermomigration simulation of metallization structures. Advanced Metallization Conference (AMC), 477-481.
Dalleau, D. ; Weide-Zaage, K. / 3-D time-depending electro- and thermomigration simulation of metallization structures. In: Advanced Metallization Conference (AMC). 2000 ; pp. 477-481.
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abstract = "For reliability prediction in metallization structures the different migration mechanisms caused by high loading conditions become more and more important. With numerical methods like the finite element method (FEM), it is possible to determine the weakest part of the structure. This paper presents a new method for time dependent 3-dimensional degradation simulations of metallization structures stressed by high current densities. The FE-method offers the possibility to predict the progress of the degradation, and to estimate the reliability by calculating the corresponding Time To Failure (TTF) value. The simulation results are in good agreement with SEM observations and measurements.",
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AU - Weide-Zaage, K.

N1 - Copyright: Copyright 2004 Elsevier Science B.V., Amsterdam. All rights reserved.

PY - 2000

Y1 - 2000

N2 - For reliability prediction in metallization structures the different migration mechanisms caused by high loading conditions become more and more important. With numerical methods like the finite element method (FEM), it is possible to determine the weakest part of the structure. This paper presents a new method for time dependent 3-dimensional degradation simulations of metallization structures stressed by high current densities. The FE-method offers the possibility to predict the progress of the degradation, and to estimate the reliability by calculating the corresponding Time To Failure (TTF) value. The simulation results are in good agreement with SEM observations and measurements.

AB - For reliability prediction in metallization structures the different migration mechanisms caused by high loading conditions become more and more important. With numerical methods like the finite element method (FEM), it is possible to determine the weakest part of the structure. This paper presents a new method for time dependent 3-dimensional degradation simulations of metallization structures stressed by high current densities. The FE-method offers the possibility to predict the progress of the degradation, and to estimate the reliability by calculating the corresponding Time To Failure (TTF) value. The simulation results are in good agreement with SEM observations and measurements.

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