Details
Original language | English |
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Title of host publication | Slow Light, Fast Light, and Opto-Atomic Precision Metrology X |
Editors | Jacob Scheuer, Selim M. Shahriar |
Publisher | SPIE |
ISBN (electronic) | 9781510606791 |
Publication status | Published - 20 Feb 2017 |
Event | Slow Light, Fast Light, and Opto-Atomic Precision Metrology X 2017 - San Francisco, United States Duration: 30 Jan 2017 → 2 Feb 2017 |
Publication series
Name | Proceedings of SPIE - The International Society for Optical Engineering |
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Volume | 10119 |
ISSN (Print) | 0277-786X |
ISSN (electronic) | 1996-756X |
Keywords
- Atomic clock, Precision below the SQL, Squeezed vacuum
ASJC Scopus subject areas
- Materials Science(all)
- Electronic, Optical and Magnetic Materials
- Physics and Astronomy(all)
- Condensed Matter Physics
- Computer Science(all)
- Computer Science Applications
- Mathematics(all)
- Applied Mathematics
- Engineering(all)
- Electrical and Electronic Engineering
Cite this
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Slow Light, Fast Light, and Opto-Atomic Precision Metrology X. ed. / Jacob Scheuer; Selim M. Shahriar. SPIE, 2017. 101190D (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 10119).
Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
}
TY - GEN
T1 - 0.75 atoms improve the clock signal of 10,000 atoms
AU - Kruse, I.
AU - Lange, K.
AU - Peise, J.
AU - Lücke, B.
AU - Pezzè, L.
AU - Arlt, J.
AU - Ertmer, W.
AU - Lisdat, C.
AU - Santos, L.
AU - Smerzi, A.
AU - Klempt, C.
PY - 2017/2/20
Y1 - 2017/2/20
KW - Atomic clock
KW - Precision below the SQL
KW - Squeezed vacuum
UR - http://www.scopus.com/inward/record.url?scp=85020491746&partnerID=8YFLogxK
U2 - 10.1117/12.2250786
DO - 10.1117/12.2250786
M3 - Conference contribution
AN - SCOPUS:85020491746
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - Slow Light, Fast Light, and Opto-Atomic Precision Metrology X
A2 - Scheuer, Jacob
A2 - Shahriar, Selim M.
PB - SPIE
T2 - Slow Light, Fast Light, and Opto-Atomic Precision Metrology X 2017
Y2 - 30 January 2017 through 2 February 2017
ER -