Publications
- 2010
- Published
Exemplified calculation of stress migration in a 90nm node via structure
Weide-Zaage, K., 2010, 2010 11th International Conference on Thermal, Mechanical and Multi-Physics Simulation, and Experiments in Microelectronics and Microsystems, EuroSimE 2010. 5464542. (2010 11th International Conference on Thermal, Mechanical and Multi-Physics Simulation, and Experiments in Microelectronics and Microsystems, EuroSimE 2010).Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
- Published
Hardware mapping of a video-based approach for real-time evaluation of angular histograms on a modular coprocessor architecture
Flatt, H., Tarnowsky, A., Blume, H. & Pirsch, P., 2010, In: Advances in Radio Science.Research output: Contribution to journal › Article › Research › peer review
- Published
Influence of the activation energy of the different migration effects on failure locations in metallization
Weide-Zaage, K., Ciptokusumo, J. & Aubel, O., 2010, Stress-Induced Phenomena in Metallization - Eleventh International Workshop on Stress-Induced Phenomena in Metallization. p. 85-90 6 p. (AIP Conference Proceedings; vol. 1300).Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
- Published
Mechanical characterization of copper based metallizations with different via-bottom geometries
Ciptokusumo, J., Weide-Zaage, K. & Aubel, O., 2010, IPFA 2010 - 17th International Symposium on the Physical and Failure Analysis of Integrated Circuits. 5532227. (Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA).Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
- Published
PoP prototyping by determination of matter transport effects
Meinshausen, L., Weide-Zaage, K., Feng, W. & Frémont, H., 2010, 2010 IEEE CPMT Symposium Japan, ICSJ10. 5679664. (2010 IEEE CPMT Symposium Japan, ICSJ10).Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
- Published
Principles for simulation of barrier cracking due to high stress
Ciptokusumo, J., Weide-Zaage, K. & Aubel, O., 2010, 2010 11th International Conference on Thermal, Mechanical and Multi-Physics Simulation, and Experiments in Microelectronics and Microsystems, EuroSimE 2010. 5464617. (2010 11th International Conference on Thermal, Mechanical and Multi-Physics Simulation, and Experiments in Microelectronics and Microsystems, EuroSimE 2010).Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
- Published
Semiconductor nanostructures in crystalline rare earth oxide for nanoelectronic device applications
Laha, A., Bugiel, E., Ranjith, R., Osten, H. J., Fissel, A., Afanas'Ev, V. V. & Badylevich, M., 2010, 2010 International Conference on Microelectronics, ICM'10. p. 248-251 4 p. 5696129. (Proceedings of the International Conference on Microelectronics, ICM).Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
- Published
Si Nanostructures Embedded into Crystalline Rare Earth Oxide Matrix for Opto and Nano Electronic Devices
Osten, H. J., Laha, A. & Fissel, A., 2010, 4th International Conference on Quantum, Nano and Micro Technologies, ICQNM 2010. p. 38-42 5 p. 5437795. (4th International Conference on Quantum, Nano and Micro Technologies, ICQNM 2010).Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
- Published
Underfill and mold compound influence on PoP aging under high current and high temperature stress
Meinshausen, L., Weide-Zaage, K. & Frémont, H., 2010, Electronics System Integration Technology Conference, ESTC 2010 - Proceedings. 5642803. (Electronics System Integration Technology Conference, ESTC 2010 - Proceedings).Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
- Published
Virtual prototyping of PoP interconnections regarding electrically activated mechanisms
Meinshausen, L., Weide-Zaage, K., Frémont, H. & Feng, W., 2010, 2010 11th International Conference on Thermal, Mechanical and Multi-Physics Simulation, and Experiments in Microelectronics and Microsystems, EuroSimE 2010. 5464618. (2010 11th International Conference on Thermal, Mechanical and Multi-Physics Simulation, and Experiments in Microelectronics and Microsystems, EuroSimE 2010).Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
- 2009
- Published
Size-dependent interface band alignment between Si nanocrystals and lattice-matched Gd2O3
Afanas'ev, V. V., Badylevich, M., Stesmans, A., Laha, A., Osten, H. J. & Fissel, A., 7 Sept 2009, In: Applied physics letters. 95, 10, 102107.Research output: Contribution to journal › Article › Research › peer review
- Published
Investigation of stress distribution in via bottom of Cu-via structures with different via form by means of submodeling
Ciptokusumo, J., Weide-Zaage, K. & Aubel, O., Sept 2009, In: Microelectronics reliability. 49, 9-11, p. 1090-1095 6 p.Research output: Contribution to journal › Article › Research › peer review
- Published
Epitaxial Lanthanide Oxide based Gate Dielectrics
Osten, H. J., Laha, A. & Fissel, A., 17 Aug 2009, CMOS Gate-Stack Scaling - Materials, Interfaces and Reliability Implications. Materials Research Society, p. 97-108 12 p. (Materials Research Society Symposium Proceedings; vol. 1155).Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
- Published
Epitaxial growth of Gd2O3 on surfactant-mediated grown Ge films on Si(0 0 1) substrates
Wietler, T. F., Laha, A., Bugiel, E., Czernohorsky, M., Dargis, R., Fissel, A. & Osten, H. J., Aug 2009, In: Solid-State Electronics. 53, 8, p. 833-836 4 p.Research output: Contribution to journal › Article › Research › peer review
- Published
Development of Multi-Step Procedure for Epitaxial Growth of Crystalline Silicon on Rare-Earth-Metal Oxide for SOI-Applications
Dargis, R., Fissel, A., Bugiel, E., Schwendt, D., Wietler, T., Laha, A. & Osten, H. J., 4 Apr 2009, In: e-Journal of Surface Science and Nanotechnology. 7, p. 405-408 4 p.Research output: Contribution to journal › Article › Research › peer review
- Published
Crystal structure and strain state of molecular beam epitaxial grown Gd2O3 on Si(1 1 1) substrates: A diffraction study
Wang, J. X., Laha, A., Fissel, A., Schwendt, D., Dargis, R., Watahiki, T., Shayduk, R., Braun, W., Liu, T. M. & Osten, H. J., 17 Mar 2009, In: Semiconductor Science and Technology. 24, 4, 045021.Research output: Contribution to journal › Article › Research › peer review
- Published
Epitaxial Growth and Properties of Silicon on Crystalline Rare-Earth-Metal Oxide for SOI-Applications
Dargis, R., Fissel, A., Bugiel, E., Schwendt, D., Wietler, T., Laha, A. & Osten, H. J., 12 Mar 2009, In: Medziagotyra. 15, 1, p. 11-15 5 p.Research output: Contribution to journal › Article › Research › peer review
- Published
Integration of low dimensional crystalline Si into functional epitaxial oxides
Laha, A., Bugiel, E., Dargis, R., Schwendt, D., Badylevich, M., Afanas'ev, V. V., Stesmans, A., Fissel, A. & Osten, H. J., Mar 2009, In: Microelectronics journal. 40, 3, p. 633-637 5 p.Research output: Contribution to journal › Article › Research › peer review
- Published
Effect of Domain Boundaries on Dielectric Properties of Lanthanide Oxide based Gate Dielectrics
Laha, A., Bugiel, E., Wang, J. X., Osten, H. J. & Fissel, A., 2009, 3rd International Conference on Signals, Circuits and Systems, SCS 2009. 5414203. (3rd International Conference on Signals, Circuits and Systems, SCS 2009).Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
- Published
Electrically driven matter transport effects in PoP interconnections
Feng, W., Weide-Zaage, K., Verdier, F., Plano, B., Guédon-Gracia, A. & Frémont, H., 2009, 2009 10th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2009. 4938457. (2009 10th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2009).Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review