Publications
- 2019
- Published
Design Space Exploration von Architekturen zur echtzeitfähigen Implementierung schneller Backprojection-Verfahren
Wielage, M., 2019, 1. Auflage ed. München. 165 p. (Informationstechnik)Research output: Book/Report › Monograph › Research › peer review
- Published
Design Space Exploration von Architekturen zur echtzeitfähigen Implementierung schneller Backprojection-Verfahren
Wielage, M., 2019, Hannover. 165 p.Research output: Thesis › Doctoral thesis
- 2018
- Published
Graphical Model MAP Inference with Continuous Label Space in Computer Vision
Müller, O., 2018, 1. Auflage ed. Düsseldorf. 141 p. (Informatik/ Kommunikation; vol. 860)Research output: Book/Report › Monograph › Research › peer review
- Published
Graphical Model MAP Inference with Continuous Label Space in Computer Vision
Müller, O., 2018Research output: Thesis › Doctoral thesis
- Published
Manifold Learning for Super Resolution
Pérez Pellitero, E., 2018, 1 ed. Düsseldorf. 114 p. (Informatik/ Kommunikation; vol. 859)Research output: Book/Report › Monograph › Research › peer review
- Published
Manifold Learning for Super Resolution
Pérez Pellitero, E., 2018, 114 p.Research output: Thesis › Doctoral thesis
- 2017
- Published
Inner tegument proteins of Herpes Simplex Virus are sufficient for intracellular capsid motility in neurons but not for axonal targeting
Buch, A., Müller, O., Ivanova, L., Döhner, K., Bialy, D., Bosse, J. B., Pohlmann, A., Binz, A., Hegemann, M., Nagel, C. H., Koltzenburg, M., Viejo-Borbolla, A., Rosenhahn, B., Bauerfeind, R. & Sodeik, B., 28 Dec 2017, In: PLoS pathogens. 13, 12, p. e1006813Research output: Contribution to journal › Article › Research › peer review
- Published
High Performance and Low Power Architectures: GPU vs. FPGA for Fast Factorized Backprojection
Wielage, M., Cholewa, F., Fahnemann, C., Pirsch, P. & Blume, H., 2 Jul 2017, 2017 Fifth International Symposium on Computing and Networking. IEEE Computer Society, p. 351-357 7 p.Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
- Published
In Situ Waveform Measurements Within Doherty Power Amplifier Under Operational Conditions
Probst, S., Denicke, E. & Geck, B., Jun 2017, In: IEEE Transactions on Microwave Theory and Techniques. 65, 6, p. 2192-2200 9 p.Research output: Contribution to journal › Article › Research › peer review
- 2016
- Published
PSyCo: Manifold Span Reduction for Super Resolution
Perez-Pellitero, E., Salvador, J., Ruiz-Hidalgo, J. & Rosenhahn, B., 9 Dec 2016, Proceedings: 29th IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2016. IEEE Computer Society, p. 1837-1845 9 p. 7780572. (Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition; vol. 2016-December).Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
- E-pub ahead of print
Tracking with multi-level features
Henschel, R., Leal-Taixé, L., Rosenhahn, B. & Schindler, K., 25 Jul 2016, (E-pub ahead of print).Research output: Working paper/Preprint › Preprint
- Published
Antipodally invariant metrics for fast regression-based super-resolution
Perez-Pellitero, E., Salvador, J., Ruiz-Hidalgo, J. & Rosenhahn, B., Jun 2016, In: IEEE Transactions on Image Processing. 25, 6, p. 2456-2468 13 p., 7445242.Research output: Contribution to journal › Article › Research › peer review
- Published
Half hypersphere confinement for piecewise linear regression
Perez-Pellitero, E., Salvador, J., Ruiz-Hidalgo, J. & Rosenhahn, B., 23 May 2016, 2016 IEEE Winter Conference on Applications of Computer Vision, WACV 2016. Institute of Electrical and Electronics Engineers Inc., 7477651Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
- 2015
- Published
Dynamical IMC-growth calculation
Meinshausen, L., Weide-Zaage, K. & Frémont, H., Aug 2015, In: Microelectronics reliability. 55, 9-10, p. 1832-1837 6 p.Research output: Contribution to journal › Article › Research › peer review
- Published
Effect of thermal aging on the electrical resistivity of Fe-added SAC105 solder alloys
Sabri, M. F. M., Nordin, N. I. M., Said, S. M., Amin, N. A. A. M., Arof, H., Jauhari, I., Ramli, R. & Weide-Zaage, K., Aug 2015, In: Microelectronics reliability. 55, 9-10, p. 1882-1885 4 p.Research output: Contribution to journal › Article › Research › peer review
- Published
Life time characterization for a highly robust metallization
Weide-Zaage, K., Kludt, Ackermann, M., Hein, V. & Erstling, M., 6 May 2015, 2015 16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2015. Institute of Electrical and Electronics Engineers Inc., 7103123Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
- Published
Fast super-resolution via dense local training and inverse regressor search
Pérez-Pellitero, E., Salvador, J., Torres-Xirau, I., Ruiz-Hidalgo, J. & Rosenhahn, B., 16 Apr 2015, ACCV 2014: Computer Vision -- ACCV 2014. Vol. 9005. p. 346-359 14 p. (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)).Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
- Published
Electro- and thermomigration induced Cu3Sn and Cu6Sn5 formation in SnAg3.0Cu0.5 bumps
Meinshausen, L., Frémont, H., Weide-Zaage, K. & Plano, B., 1 Jan 2015, In: Microelectronics reliability. 55, 1, p. 192-200 9 p.Research output: Contribution to journal › Article › Research › peer review
- 2014
- Published
Degradation behavior in upstream/downstream via test structures
Kludt, J., Weide-Zaage, K., Ackermann, M., Hein, V. & Kovács, C., 1 Sept 2014, In: Microelectronics reliability. 54, 9-10, p. 1724-1728 5 p.Research output: Contribution to journal › Article › Research › peer review
- Published
Evaluation new corner stress relief structure layout for high robust metallization
Hein, V., Kludt, J. & Weide-Zaage, K., 1 Sept 2014, In: Microelectronics reliability. 54, 9-10, p. 1977-1981 5 p.Research output: Contribution to journal › Article › Research › peer review