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Institute of Electronic Materials and Devices

Organisational unit: Institute

Type of address: Visitor address.
Schneiderberg 32
30167
Hannover
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Publications

  1. 2010
  2. Published

    Preparation and electrical characterization of amorphous BaO, SrO and Ba0.7Sr0.3O as high-k gate dielectrics

    Müller-Sajak, D., Cosceev, A., Brand, C., Hofmann, K. R. & Pfnür, H., 10 Jul 2010, In: Physica Status Solidi (C) Current Topics in Solid State Physics. 7, 2, p. 316-320 5 p.

    Research output: Contribution to journalConference articleResearchpeer review

  3. Published

    Epitaxial multi-component rare-earth oxide: A high-k material with ultralow mismatch to Si

    Wang, J., Liu, T., Wang, Z., Bugiel, E., Laha, A., Watahiki, T., Shayduk, R., Braun, W., Fissel, A. & Osten, H. J., 15 Apr 2010, In: Materials letters. 64, 7, p. 866-868 3 p.

    Research output: Contribution to journalArticleResearchpeer review

  4. Published

    Single-crystalline Si grown on single-crystalline Gd2O3 by modified solid-phase epitaxy

    Fissel, A., Dargis, R., Bugiel, E., Schwendt, D., Wietler, T., Krügener, J., Laha, A. & Osten, H. J., 26 Feb 2010, In: THIN SOLID FILMS. 518, 9, p. 2546-2550 5 p.

    Research output: Contribution to journalArticleResearchpeer review

  5. Published

    Role of boron and (√3×√3)-B surface defects on the growth mode of Si on Si(111): A photoemission and electron diffraction study

    Fissel, A., Krügener, J., Schwendt, D. & Osten, H. J., Feb 2010, In: Physica Status Solidi (A) Applications and Materials Science. 207, 2, p. 245-253 9 p.

    Research output: Contribution to journalArticleResearchpeer review

  6. Published

    Growth of Crystalline Gd2O3 Thin Films with a High-Quality Interface on Si(100) by Low-Temperature H2O-Assisted Atomic Layer Deposition

    Milanov, A. P., Xu, K., Laha, A., Bugiel, E., Ranjith, R., Schwendt, D., Osten, H. J., Parala, H., Fischer, R. A. & Devi, A., 13 Jan 2010, In: Journal of the American Chemical Society. 132, 1, p. 36-37 2 p.

    Research output: Contribution to journalArticleResearchpeer review

  7. Published

    Crystalline Gadolinium Oxide: A Promising High-k Candidate for Future CMOS Generations

    Endres, R., Gottlob, H. D. B., Schmidt, M., Schwendt, D., Osten, H. J. & Schwalke, U., 2010, Physics and Technology of High-k Materials 8. 3 ed. Electrochemical Society, Inc., p. 25-29 5 p. (ECS Transactions; vol. 33, no. 3).

    Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

  8. Published

    Effect of Ge passivation on interfacial properties of crystalline Gd2 O3 thin films grown on Si substrates

    Laha, A., Fissel, A. & Osten, H. J., 2010, In: Applied physics letters. 96, 7, 072903.

    Research output: Contribution to journalArticleResearchpeer review

  9. Published

    Effect of SiO2 ticknesses in thermal-SiO2/PECVD-SiN stacks on surface passivation of n-Type Cz silicon substrates

    Larionova, Y., Harder, N. P. & Brendel, R., 2010, 35th IEEE Photovoltaic Specialists Conference Honolulu, HI, June 20-25, 2010: Conference Proceedings. p. 1207-1209 3 p. 5614072. (Conference Record of the IEEE Photovoltaic Specialists Conference).

    Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

  10. Published

    Influence of emitter profile characteristics on thermal stability and passiviation quality of A-Si/SiNX-passivated boron emitters

    Kessler, M., Gatz, S., Altermatt, P., Harder, N. P. & Brendel, R., 2010, 35th IEEE Photovoltaic Specialists Conference Honolulu, HI, June 20-25, 2010: Conference Proceedings. p. 359-363 5 p. 5616868. (Conference Record of the IEEE Photovoltaic Specialists Conference).

    Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

  11. Published

    Semiconductor nanostructures in crystalline rare earth oxide for nanoelectronic device applications

    Laha, A., Bugiel, E., Ranjith, R., Osten, H. J., Fissel, A., Afanas'Ev, V. V. & Badylevich, M., 2010, 2010 International Conference on Microelectronics, ICM'10. p. 248-251 4 p. 5696129. (Proceedings of the International Conference on Microelectronics, ICM).

    Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

  12. Published

    Si Nanostructures Embedded into Crystalline Rare Earth Oxide Matrix for Opto and Nano Electronic Devices

    Osten, H. J., Laha, A. & Fissel, A., 2010, 4th International Conference on Quantum, Nano and Micro Technologies, ICQNM 2010. p. 38-42 5 p. 5437795. (4th International Conference on Quantum, Nano and Micro Technologies, ICQNM 2010).

    Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

  13. Published

    The role of thermal and electronic pressure in the picosecond acoustic response of femtosecond laser-excited solids

    Shymanovich, U., Nicoul, M., Kähle, S., Lu, W., Tarasevitch, A., Zhou, P., Wietler, T., Von Hoegen, M. H., Von Der Linde, D. & Sokolowski-Tinten, K., 2010, Ultrafast Processes in Materials Science. p. 111-116 6 p. (Materials Research Society Symposium Proceedings; vol. 1230).

    Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

  14. Published

    Trapping-related recombination of charge carriers in silicon

    Gogolin, R., Harder, N. P. & Brendel, R., 2010, 35th IEEE Photovoltaic Specialists Conference Honolulu, HI, June 20-25, 2010: Conference Proceedings. p. 443-446 4 p. 5616743. (Conference Record of the IEEE Photovoltaic Specialists Conference).

    Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

  15. 2009
  16. Published

    Influence of Sb induced surface faceting on structural properties of relaxed Ge films on Si(001)

    Wietler, T. F., Rugeramigabo, E. P., Bugiel, E. & Hofmann, K. R., 1 Dec 2009, Physics of Semiconductors - 29th International Conference, ICPS 29. p. 15-16 2 p. (AIP Conference Proceedings; vol. 1199).

    Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

  17. Published

    The thermal stability of Pt/epitaxial Gd2O3 /Si stacks and its dependence on heat-treatment ambient

    Lipp, E., Osten, H. J. & Eizenberg, M., 1 Dec 2009, In: Journal of applied physics. 106, 11, 113505.

    Research output: Contribution to journalArticleResearchpeer review

  18. Published

    Encapsulated solid phase epitaxy of a Ge quantum well embedded in an epitaxial rare earth oxide

    Laha, A., Bugiel, E., Jestremski, M., Ranjith, R., Fissel, A. & Osten, H. J., 29 Oct 2009, In: NANOTECHNOLOGY. 20, 47, 475604.

    Research output: Contribution to journalArticleResearchpeer review

  19. Published

    Investigation of the electrical properties of the alkaline-earth oxides BaO, SrO and Ba0.7Sr0.3O on Si(001) as alternative gate dielectrics

    Cosceev, A., Müller-Sajak, D., Pfnür, H. & Hofmann, K. R., 22 Oct 2009, In: Thin Solid Films. 518, 6 SUPPL. 1, p. S281-S284

    Research output: Contribution to journalArticleResearchpeer review

  20. Published

    Size-dependent interface band alignment between Si nanocrystals and lattice-matched Gd2O3

    Afanas'ev, V. V., Badylevich, M., Stesmans, A., Laha, A., Osten, H. J. & Fissel, A., 7 Sept 2009, In: Applied physics letters. 95, 10, 102107.

    Research output: Contribution to journalArticleResearchpeer review

  21. Published

    Epitaxial Lanthanide Oxide based Gate Dielectrics

    Osten, H. J., Laha, A. & Fissel, A., 17 Aug 2009, CMOS Gate-Stack Scaling - Materials, Interfaces and Reliability Implications. Materials Research Society, p. 97-108 12 p. (Materials Research Society Symposium Proceedings; vol. 1155).

    Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

  22. Published

    Epitaxial growth of Gd2O3 on surfactant-mediated grown Ge films on Si(0 0 1) substrates

    Wietler, T. F., Laha, A., Bugiel, E., Czernohorsky, M., Dargis, R., Fissel, A. & Osten, H. J., Aug 2009, In: Solid-State Electronics. 53, 8, p. 833-836 4 p.

    Research output: Contribution to journalArticleResearchpeer review