Publications
- 2009
- Published
Development of Multi-Step Procedure for Epitaxial Growth of Crystalline Silicon on Rare-Earth-Metal Oxide for SOI-Applications
Dargis, R., Fissel, A., Bugiel, E., Schwendt, D., Wietler, T., Laha, A. & Osten, H. J., 4 Apr 2009, In: e-Journal of Surface Science and Nanotechnology. 7, p. 405-408 4 p.Research output: Contribution to journal › Article › Research › peer review
- Published
Crystal structure and strain state of molecular beam epitaxial grown Gd2O3 on Si(1 1 1) substrates: A diffraction study
Wang, J. X., Laha, A., Fissel, A., Schwendt, D., Dargis, R., Watahiki, T., Shayduk, R., Braun, W., Liu, T. M. & Osten, H. J., 17 Mar 2009, In: Semiconductor Science and Technology. 24, 4, 045021.Research output: Contribution to journal › Article › Research › peer review
- Published
Epitaxial Growth and Properties of Silicon on Crystalline Rare-Earth-Metal Oxide for SOI-Applications
Dargis, R., Fissel, A., Bugiel, E., Schwendt, D., Wietler, T., Laha, A. & Osten, H. J., 12 Mar 2009, In: Medziagotyra. 15, 1, p. 11-15 5 p.Research output: Contribution to journal › Article › Research › peer review
- Published
Integration of low dimensional crystalline Si into functional epitaxial oxides
Laha, A., Bugiel, E., Dargis, R., Schwendt, D., Badylevich, M., Afanas'ev, V. V., Stesmans, A., Fissel, A. & Osten, H. J., Mar 2009, In: Microelectronics journal. 40, 3, p. 633-637 5 p.Research output: Contribution to journal › Article › Research › peer review
- Published
Complementary metal oxide semiconductor integration of epitaxial Gd2 O3
Lemme, M. C., Gottlob, H. D. B., Echtermeyer, T. J., Schmidt, M., Kurz, H., Endres, R., Schwalke, U., Czernohorkky, M., Tetzlaff, D. & Osten, H. J., 9 Feb 2009, In: Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 27, 1, p. 258-261 4 p.Research output: Contribution to journal › Article › Research › peer review
- Published
Influence of boron on the initial stages of Si molecular beam epitaxy on Si(1 1 1) studied by reflection high-energy electron diffraction
Fissel, A., Krügener, J. & Osten, H. J., 1 Feb 2009, In: Surface science. 603, 3, p. 477-481 5 p.Research output: Contribution to journal › Article › Research › peer review
- Published
Effect of Domain Boundaries on Dielectric Properties of Lanthanide Oxide based Gate Dielectrics
Laha, A., Bugiel, E., Wang, J. X., Osten, H. J. & Fissel, A., 2009, 3rd International Conference on Signals, Circuits and Systems, SCS 2009. 5414203. (3rd International Conference on Signals, Circuits and Systems, SCS 2009).Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
- Published
Growth of Epitaxial Lanthanide Oxide based Gate Dielectrics
Osten, H. J., Laha, A., Bugiel, E., Schwendt, D. & Fissel, A., 2009, 2009 3rd International Conference on Signals, Circuits & Systems: (SCS). 5414212Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
- Published
Interface and Bulk Properties of MBE-Grown Rare-Earth Metal Oxides on Silicon
Gomeniuk, Y. Y., Gomeniuk, Y. V., Nazarov, A. N., Lysenko, V. S., Osten, H. J. & Laha, A., 2009, ECS Transactions - Physics and Technology of High-k Gate Dielectrics 7. 6 ed. Electrochemical Society, Inc., p. 353-358 6 p. (ECS Transactions; vol. 25, no. 6).Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
- Published
Stability of crystalline Gd2O3 thin films on silicon during post-growth processing
Schwendt, D., Tetzlaff, D., Bugiel, E., Osten, H. J. & Gottlob, H. D. B., 2009, 3rd International Conference on Signals, Circuits and Systems, SCS 2009. 5414206. (3rd International Conference on Signals, Circuits and Systems, SCS 2009).Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
- Published
Structural and strain relaxation study of epitaxially grown nanothick Nd2O3/Si(111) heterostructure
Wang, J., Laha, A., Fissel, A., Schwendt, D., Dargis, R., Watahiki, T., Shayduk, R., Braun, W., Liu, T. & Osten, H. J., 2009, 4th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2009. p. 436-440 5 p. 5068613. (4th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2009).Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
- 2008
- Published
Electronic structure at interfaces of cubic Gd2O3 with embedded Si nanocrystals
Badylevich, M., Shamuilia, S., Afanas'ev, V. V., Stesmans, A., Laha, A., Osten, H. J. & Fissel, A., Dec 2008, In: Microelectronic engineering. 85, 12, p. 2382-2384 3 p.Research output: Contribution to journal › Article › Research › peer review
- Published
Si-nanoclusters embedded into epitaxial rare earth oxides: Potential candidate for nonvolatile memory applications
Laha, A., Bugiel, E., Fissel, A. & Osten, H. J., Dec 2008, In: Microelectronic engineering. 85, 12, p. 2350-2353 4 p.Research output: Contribution to journal › Article › Research › peer review
- Published
Tuning strain relaxation by surface morphology: Surfactant-mediated epitaxy of germanium on silicon
Wietler, T. F., Bugiel, E. & Hofmann, K. R., 30 Nov 2008, In: Applied surface science. 255, 3, p. 778-780 3 p.Research output: Contribution to journal › Article › Research › peer review
- Published
Effect of oxide structure on the Fermi-level pinning at metal/ Gd 2 O3 interfaces
Lipp, E., Eizenberg, M., Czernohorsky, M. & Osten, H. J., 14 Nov 2008, In: Applied physics letters. 93, 19, 193513.Research output: Contribution to journal › Article › Research › peer review
- Published
Band offsets between Si and epitaxial rare earth sesquioxides (RE 2O3, RE=La,Nd,Gd,Lu): Effect of 4f -shell occupancy
Afanas'ev, V. V., Badylevich, M., Stesmans, A., Laha, A., Osten, H. J., Fissel, A., Tian, W., Edge, L. F. & Schlom, D. G., 11 Nov 2008, In: Applied physics letters. 93, 19, 192105.Research output: Contribution to journal › Article › Research › peer review
- Published
Effect of domain boundaries on the electrical properties of crystalline Gd2 O3 thin films
Laha, A., Bugiel, E., Wang, J. X., Sun, Q. Q., Fissel, A. & Osten, H. J., 6 Nov 2008, In: Applied physics letters. 93, 18, 182907.Research output: Contribution to journal › Article › Research › peer review
- Published
Relaxed germanium films on silicon (110)
Wietler, T. F., Bugiel, E. & Hofmann, K. R., 3 Nov 2008, In: THIN SOLID FILMS. 517, 1, p. 272-274 3 p.Research output: Contribution to journal › Article › Research › peer review
- Published
High-k-oxide/silicon interfaces characterized by capacitance frequency spectroscopy
Raeissi, B., Piscator, J., Engström, O., Hall, S., Buiu, O., Lemme, M. C., Gottlob, H. D. B., Hurley, P. K., Cherkaoui, K. & Osten, H. J., Sept 2008, In: Solid-State Electronics. 52, 9, p. 1274-1279 6 p.Research output: Contribution to journal › Article › Research › peer review
- Published
Observation of near interface oxide traps in single crystalline Nd2 O3 on Si(111) by quasistatic C-V method
Sun, Q. Q., Laha, A., Ding, S. J., Zhang, D. W., Osten, H. J. & Fissel, A., 27 Aug 2008, In: Applied physics letters. 93, 8, 083509.Research output: Contribution to journal › Article › Research › peer review