Titles |
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Additional searchable titles | Can Reliab Symp, 5th, Proc, MICROELECTRON RELIAB, Microelectronics and Reliability, Semicond Technol, Sel Pap Presented at Annu SEMINEX Tech Semin and Exhib |
ISSNs | 0026-2714 |
Publisher | Elsevier Ltd. |
ZDB-ID | 240853-3 |
Scopus ID | 26717 |