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XPS X-Ray Photoelectron Spectrometer (PHI VersaProbe III, with UPS, Auger, Ar-Cluster-Beam etc.)

Facility/Equipment: Major Research Instrumentation

Description

Elemental analysis on surfaces, typical measuring range approx. 10 nm, depth profile measurements using Ar-Custer bombardment, binding/oxidation state of the elements can be determined

Research Service (CoreNAT - Faculty of Natural Sciences)