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FE-SEM Field-Emission Electron Microscope (JEOL JSM-6700F)

Facility/Equipment: Research Instrumentation

Description

with energy-dispersive X-ray spectrometer (Oxford Instruments INCA300), secondary electron contrast (SE), in-lens SE, backscattered electron contrast (BSE)

Access to facility/equipment

NameArmin Feldhoff
Emails
Phone05117622940
Available for loan/bookingPlease contact the contact person

Research Service (CoreNAT - Faculty of Natural Sciences)