Details
| Originalsprache | Englisch |
|---|---|
| Seiten (von - bis) | 409-416 |
| Seitenumfang | 8 |
| Fachzeitschrift | Progress in Photovoltaics: Research and Applications |
| Jahrgang | 25 |
| Ausgabenummer | 6 |
| Frühes Online-Datum | 1 März 2017 |
| Publikationsstatus | Veröffentlicht - Juni 2017 |
Abstract
In this paper, we report on the stability of p-type passivated emitter and rear cells under ultraviolet (UV) exposure with various silicone nitride passivation coatings and embedded in different encapsulation polymers. Our results reveal that UV transparent polymers can result in a module power loss of up to 6% under a UV irradiation dose of 497 kWh/m2. We show that the degradation in power is caused by a reduction in open circuit voltage. This loss is related to an increased recombination in the cell, which we ascribe to a degradation of the surface passivation. With ray tracing simulations, we determine the number of photons reaching the passivation interface. Assuming that all photons with energies above 3.5 eV de-passivate the interface is in agreement with our experimental results.
ASJC Scopus Sachgebiete
- Werkstoffwissenschaften (insg.)
- Elektronische, optische und magnetische Materialien
- Energie (insg.)
- Erneuerbare Energien, Nachhaltigkeit und Umwelt
- Physik und Astronomie (insg.)
- Physik der kondensierten Materie
- Ingenieurwesen (insg.)
- Elektrotechnik und Elektronik
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in: Progress in Photovoltaics: Research and Applications, Jahrgang 25, Nr. 6, 06.2017, S. 409-416.
Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Peer-Review
}
TY - JOUR
T1 - UV-induced degradation of PERC solar modules with UV-transparent encapsulation materials
AU - Witteck, Robert
AU - Veith-Wolf, Boris
AU - Schulte-Huxel, Henning
AU - Morlier, Arnaud
AU - Vogt, Malte R.
AU - Köntges, Marc
AU - Brendel, Rolf
N1 - Publisher Copyright: Copyright © 2017 John Wiley & Sons, Ltd. Copyright: Copyright 2017 Elsevier B.V., All rights reserved.
PY - 2017/6
Y1 - 2017/6
N2 - In this paper, we report on the stability of p-type passivated emitter and rear cells under ultraviolet (UV) exposure with various silicone nitride passivation coatings and embedded in different encapsulation polymers. Our results reveal that UV transparent polymers can result in a module power loss of up to 6% under a UV irradiation dose of 497 kWh/m2. We show that the degradation in power is caused by a reduction in open circuit voltage. This loss is related to an increased recombination in the cell, which we ascribe to a degradation of the surface passivation. With ray tracing simulations, we determine the number of photons reaching the passivation interface. Assuming that all photons with energies above 3.5 eV de-passivate the interface is in agreement with our experimental results.
AB - In this paper, we report on the stability of p-type passivated emitter and rear cells under ultraviolet (UV) exposure with various silicone nitride passivation coatings and embedded in different encapsulation polymers. Our results reveal that UV transparent polymers can result in a module power loss of up to 6% under a UV irradiation dose of 497 kWh/m2. We show that the degradation in power is caused by a reduction in open circuit voltage. This loss is related to an increased recombination in the cell, which we ascribe to a degradation of the surface passivation. With ray tracing simulations, we determine the number of photons reaching the passivation interface. Assuming that all photons with energies above 3.5 eV de-passivate the interface is in agreement with our experimental results.
KW - encapsulation materials
KW - long term stability
KW - PERC
KW - photovoltaic devices
KW - solar modules
KW - UV degradation
UR - http://www.scopus.com/inward/record.url?scp=85014032941&partnerID=8YFLogxK
U2 - 10.1002/pip.2861
DO - 10.1002/pip.2861
M3 - Article
AN - SCOPUS:85014032941
VL - 25
SP - 409
EP - 416
JO - Progress in Photovoltaics: Research and Applications
JF - Progress in Photovoltaics: Research and Applications
SN - 1062-7995
IS - 6
ER -