TY - JOUR

T1 - Using silicon disk resonators to measure mechanical losses caused by an electric field

AU - Klochkov, Y. Yu

AU - Prokhorov, L. G.

AU - Matiushechkina, M. S.

AU - Adhikari, R. X.

AU - Mitrofanov, V. P.

N1 - Funding Information: The authors are grateful to Ashot Markosyan for help with the measurement of the resistivity of silicon wafers and Edgard Bonilla for the valuable comments. This research was supported by the Interdisciplinary Scientific and Educational School of Moscow University “Fundamental and Applied Space Research” and funded by Russian Foundation for Basic Research under Project No. 19-29-11003. This paper was assigned LIGO Document No. LIGO-P2100057.

PY - 2022/1

Y1 - 2022/1

N2 - Several projects of the next generation gravitational-wave detectors use the high purity monocrystalline silicon test masses. The electric field of the actuator that is applied to correct the position of the silicon test mass causes additional mechanical losses and associated noise. Disk mechanical resonators are widely used to study mechanical losses in multilayer optical coatings that are deposited on the test masses of gravitational-wave detectors. We use silicon disk resonators to study losses caused by an electric field. In particular, the dependence of mechanical losses on the resistivity of silicon is investigated. The resonator is a thin commercial silicon wafer in which a low frequency nodal diameter mode is excited. A DC voltage is applied between the wafer and a nearby electrode. We use two measurement configurations. In the first configuration, the dependence of losses on the resistance in the voltage supply circuit is investigated. The dependence of losses on the resistivity of silicon is investigated in the second configuration. We propose a model that relates the electric field induced mechanical loss in disk resonators to the resistivity of the material. Measurements are carried out for low and high resistivity silicon wafers. The measurement results are compared with calculations. Based on these studies, it is possible to estimate the loss and noise of the test masses of gravitational-wave detectors associated with electrostatic actuators.

AB - Several projects of the next generation gravitational-wave detectors use the high purity monocrystalline silicon test masses. The electric field of the actuator that is applied to correct the position of the silicon test mass causes additional mechanical losses and associated noise. Disk mechanical resonators are widely used to study mechanical losses in multilayer optical coatings that are deposited on the test masses of gravitational-wave detectors. We use silicon disk resonators to study losses caused by an electric field. In particular, the dependence of mechanical losses on the resistivity of silicon is investigated. The resonator is a thin commercial silicon wafer in which a low frequency nodal diameter mode is excited. A DC voltage is applied between the wafer and a nearby electrode. We use two measurement configurations. In the first configuration, the dependence of losses on the resistance in the voltage supply circuit is investigated. The dependence of losses on the resistivity of silicon is investigated in the second configuration. We propose a model that relates the electric field induced mechanical loss in disk resonators to the resistivity of the material. Measurements are carried out for low and high resistivity silicon wafers. The measurement results are compared with calculations. Based on these studies, it is possible to estimate the loss and noise of the test masses of gravitational-wave detectors associated with electrostatic actuators.

UR - http://www.scopus.com/inward/record.url?scp=85123621362&partnerID=8YFLogxK

U2 - 10.1063/5.0076311

DO - 10.1063/5.0076311

M3 - Article

C2 - 35104983

AN - SCOPUS:85123621362

VL - 93

JO - Review of scientific instruments

JF - Review of scientific instruments

SN - 0034-6748

IS - 1

M1 - 014501

ER -