Details
| Originalsprache | Englisch |
|---|---|
| Titel des Sammelwerks | 2008 International Symposium on Electromagnetic Compatibility |
| Untertitel | EMC Europe |
| Publikationsstatus | Veröffentlicht - 2008 |
| Veranstaltung | 2008 IEEE International Symposium on Electromagnetic Compatibility, EMC 2008 - Detroit, USA / Vereinigte Staaten Dauer: 18 Aug. 2008 → 22 Aug. 2008 |
Publikationsreihe
| Name | IEEE International Symposium on Electromagnetic Compatibility |
|---|---|
| ISSN (Print) | 1077-4076 |
Abstract
Multipath propagation environment effects, such as frequency-selective fading, have a strong impact on the quality of a wireless channel. For example, multipath can impact bit error rate (BER) differently from Gaussian noise. For testing wireless devices/systems in these multipath environments it is imperative to have a reliable, controllable, and statistically repeatable measurement facility. The purpose of this paper is to illustrate how the reverberation chamber can be used to simulate different multipath propagation environments. Channel characteristics such as power-delay profile, RMS-delay spread, and the Rician K-factor are examined. Results for different chamber configurations (e.g., loading of the chamber, antenna positions, etc.) are compared and their effects discussed. Results achieved inside a chamber are compared with those obtained in an actual industrial environment.
ASJC Scopus Sachgebiete
- Physik und Astronomie (insg.)
- Physik der kondensierten Materie
- Ingenieurwesen (insg.)
- Elektrotechnik und Elektronik
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2008 International Symposium on Electromagnetic Compatibility : EMC Europe. 2008. (IEEE International Symposium on Electromagnetic Compatibility).
Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review
}
TY - GEN
T1 - Use of Reverberation Chamber to Simulate the Power Delay Profile of a Wireless Environment
AU - Genender, E.
AU - Holloway, C. L.
AU - Remley, K. A.
AU - Ladbury, J.
AU - Koepke, G.
AU - Garbe, H.
PY - 2008
Y1 - 2008
N2 - Multipath propagation environment effects, such as frequency-selective fading, have a strong impact on the quality of a wireless channel. For example, multipath can impact bit error rate (BER) differently from Gaussian noise. For testing wireless devices/systems in these multipath environments it is imperative to have a reliable, controllable, and statistically repeatable measurement facility. The purpose of this paper is to illustrate how the reverberation chamber can be used to simulate different multipath propagation environments. Channel characteristics such as power-delay profile, RMS-delay spread, and the Rician K-factor are examined. Results for different chamber configurations (e.g., loading of the chamber, antenna positions, etc.) are compared and their effects discussed. Results achieved inside a chamber are compared with those obtained in an actual industrial environment.
AB - Multipath propagation environment effects, such as frequency-selective fading, have a strong impact on the quality of a wireless channel. For example, multipath can impact bit error rate (BER) differently from Gaussian noise. For testing wireless devices/systems in these multipath environments it is imperative to have a reliable, controllable, and statistically repeatable measurement facility. The purpose of this paper is to illustrate how the reverberation chamber can be used to simulate different multipath propagation environments. Channel characteristics such as power-delay profile, RMS-delay spread, and the Rician K-factor are examined. Results for different chamber configurations (e.g., loading of the chamber, antenna positions, etc.) are compared and their effects discussed. Results achieved inside a chamber are compared with those obtained in an actual industrial environment.
KW - Delay spread
KW - Multipath propagation
KW - Power delay profile
KW - Reverberation chamber
KW - Rician K-factor
KW - Wireless communications
KW - Wireless environment
UR - http://www.scopus.com/inward/record.url?scp=63549143814&partnerID=8YFLogxK
U2 - 10.1109/EMCEUROPE.2008.4786832
DO - 10.1109/EMCEUROPE.2008.4786832
M3 - Conference contribution
AN - SCOPUS:63549143814
T3 - IEEE International Symposium on Electromagnetic Compatibility
BT - 2008 International Symposium on Electromagnetic Compatibility
T2 - 2008 IEEE International Symposium on Electromagnetic Compatibility, EMC 2008
Y2 - 18 August 2008 through 22 August 2008
ER -