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| Originalsprache | undefiniert/unbekannt |
|---|---|
| Fachzeitschrift | AIP Advances |
| Publikationsstatus | Veröffentlicht - 2015 |
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Uncertainty analysis for the coefficient of band-to-band absorption of crystalline silicon. / Schinke, Carsten Jonathan; Peest, Christian; Brendel, Rolf et al.
in: AIP Advances, 2015.
in: AIP Advances, 2015.
Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Peer-Review
Schinke, CJ, Peest, C, Brendel, R, Schmidt, J, Bothe, K, Vogt, MR, Kröger, I, Winter, S & Macdonald, D 2015, 'Uncertainty analysis for the coefficient of band-to-band absorption of crystalline silicon', AIP Advances. https://doi.org/10.1063/1.4923379
Schinke, C. J., Peest, C., Brendel, R., Schmidt, J., Bothe, K., Vogt, M. R., Kröger, I., Winter, S., & Macdonald, D. (2015). Uncertainty analysis for the coefficient of band-to-band absorption of crystalline silicon. AIP Advances. https://doi.org/10.1063/1.4923379
Schinke CJ, Peest C, Brendel R, Schmidt J, Bothe K, Vogt MR et al. Uncertainty analysis for the coefficient of band-to-band absorption of crystalline silicon. AIP Advances. 2015. doi: 10.1063/1.4923379
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title = "Uncertainty analysis for the coefficient of band-to-band absorption of crystalline silicon",
author = "Schinke, {Carsten Jonathan} and Christian Peest and Rolf Brendel and Jan Schmidt and Karsten Bothe and Vogt, {Malte R.} and I. Kr{\"o}ger and Stefan Winter and Daniel Macdonald",
year = "2015",
doi = "10.1063/1.4923379",
language = "Undefined/Unknown",
journal = "AIP Advances",
issn = "2158-3226",
publisher = "American Institute of Physics",
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TY - JOUR
T1 - Uncertainty analysis for the coefficient of band-to-band absorption of crystalline silicon
AU - Schinke, Carsten Jonathan
AU - Peest, Christian
AU - Brendel, Rolf
AU - Schmidt, Jan
AU - Bothe, Karsten
AU - Vogt, Malte R.
AU - Kröger, I.
AU - Winter, Stefan
AU - Macdonald, Daniel
PY - 2015
Y1 - 2015
U2 - 10.1063/1.4923379
DO - 10.1063/1.4923379
M3 - Article
JO - AIP Advances
JF - AIP Advances
SN - 2158-3226
ER -