Details
| Originalsprache | Englisch |
|---|---|
| Aufsatznummer | 112111 |
| Fachzeitschrift | Applied physics letters |
| Jahrgang | 97 |
| Ausgabenummer | 11 |
| Publikationsstatus | Veröffentlicht - 13 Sept. 2010 |
Abstract
We present experimental evidence and theoretical explanation for simultaneous occurrence of trapping related increased apparent carrier lifetime and decreased actual recombination lifetime in low injection. This correlation is not describable by the common Hornbeck and Haynes [Phys. Rev. 97, 311 (1955)] trapping model. McIntosh, Paudyal, and Macdonald [J. Appl. Phys. 104, 084503 (2008)] recently used Shockley-Read-Hall (SRH) recombination statistics [Phys. Rev. 87, 835 (1952)] for describing the temperature dependence of trapping. Our study shows that these SRH statistics for traps also explain a causal connection between trapping-related increased apparent charge carrier lifetime and reduced actual lifetime in low injection.
ASJC Scopus Sachgebiete
- Physik und Astronomie (insg.)
- Physik und Astronomie (sonstige)
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in: Applied physics letters, Jahrgang 97, Nr. 11, 112111, 13.09.2010.
Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Peer-Review
}
TY - JOUR
T1 - Trapping-related recombination of charge carriers in silicon
AU - Harder, N. P.
AU - Gogolin, R.
AU - Brendel, R.
PY - 2010/9/13
Y1 - 2010/9/13
N2 - We present experimental evidence and theoretical explanation for simultaneous occurrence of trapping related increased apparent carrier lifetime and decreased actual recombination lifetime in low injection. This correlation is not describable by the common Hornbeck and Haynes [Phys. Rev. 97, 311 (1955)] trapping model. McIntosh, Paudyal, and Macdonald [J. Appl. Phys. 104, 084503 (2008)] recently used Shockley-Read-Hall (SRH) recombination statistics [Phys. Rev. 87, 835 (1952)] for describing the temperature dependence of trapping. Our study shows that these SRH statistics for traps also explain a causal connection between trapping-related increased apparent charge carrier lifetime and reduced actual lifetime in low injection.
AB - We present experimental evidence and theoretical explanation for simultaneous occurrence of trapping related increased apparent carrier lifetime and decreased actual recombination lifetime in low injection. This correlation is not describable by the common Hornbeck and Haynes [Phys. Rev. 97, 311 (1955)] trapping model. McIntosh, Paudyal, and Macdonald [J. Appl. Phys. 104, 084503 (2008)] recently used Shockley-Read-Hall (SRH) recombination statistics [Phys. Rev. 87, 835 (1952)] for describing the temperature dependence of trapping. Our study shows that these SRH statistics for traps also explain a causal connection between trapping-related increased apparent charge carrier lifetime and reduced actual lifetime in low injection.
UR - http://www.scopus.com/inward/record.url?scp=77956815454&partnerID=8YFLogxK
U2 - 10.1063/1.3490240
DO - 10.1063/1.3490240
M3 - Article
AN - SCOPUS:77956815454
VL - 97
JO - Applied physics letters
JF - Applied physics letters
SN - 0003-6951
IS - 11
M1 - 112111
ER -