Transformer diagnostic and assessment methodology

Publikation: Beitrag in FachzeitschriftKonferenzaufsatz in FachzeitschriftForschungPeer-Review

Autoren

  • X. Zhang
  • E. Gockenbach
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Details

OriginalspracheEnglisch
Aufsatznummer4570295
Seiten (von - bis)128-131
Seitenumfang4
FachzeitschriftConference Record of IEEE International Symposium on Electrical Insulation
PublikationsstatusVeröffentlicht - 18 Juli 2008
Veranstaltung2008 IEEE International Symposium on Electrical Insulation, ISEI 2008 - Vancouver, BC, Kanada
Dauer: 9 Juni 200812 Juni 2008

Abstract

In this paper a methodology has been developed to use information derived from condition monitoring and diagnostics for rehabilitation purposes of transformers. The interpretation and understanding of the test data are obtained from the International Standards. In particular, the standardization of diagnostic and analysis techniques are being improved that will enable regular staff to more easily use the test results and will reduce the need for interpretation by experts.

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Transformer diagnostic and assessment methodology. / Zhang, X.; Gockenbach, E.
in: Conference Record of IEEE International Symposium on Electrical Insulation, 18.07.2008, S. 128-131.

Publikation: Beitrag in FachzeitschriftKonferenzaufsatz in FachzeitschriftForschungPeer-Review

Zhang, X & Gockenbach, E 2008, 'Transformer diagnostic and assessment methodology', Conference Record of IEEE International Symposium on Electrical Insulation, S. 128-131. https://doi.org/10.1109/ELINSL.2008.4570295
Zhang, X., & Gockenbach, E. (2008). Transformer diagnostic and assessment methodology. Conference Record of IEEE International Symposium on Electrical Insulation, 128-131. Artikel 4570295. https://doi.org/10.1109/ELINSL.2008.4570295
Zhang X, Gockenbach E. Transformer diagnostic and assessment methodology. Conference Record of IEEE International Symposium on Electrical Insulation. 2008 Jul 18;128-131. 4570295. doi: 10.1109/ELINSL.2008.4570295
Zhang, X. ; Gockenbach, E. / Transformer diagnostic and assessment methodology. in: Conference Record of IEEE International Symposium on Electrical Insulation. 2008 ; S. 128-131.
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