Tool-supported design space exploration of a processor system for SIFT-feature detection

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OriginalspracheEnglisch
Titel des Sammelwerks2017 IEEE 7th International Conference on Consumer Electronics - Berlin (ICCE-Berlin)
Herausgeber (Verlag)IEEE Computer Society
Seiten168-169
Seitenumfang2
ISBN (elektronisch)9781509040148
ISBN (Print)978-1-5090-4015-5
PublikationsstatusVeröffentlicht - 18 Dez. 2017
Veranstaltung7th IEEE International Conference on Consumer Electronics - Berlin, ICCE-Berlin 2017 - Berlin, Deutschland
Dauer: 3 Sept. 20176 Sept. 2017

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Tool-supported design space exploration of a processor system for SIFT-feature detection. / Hartig, Julian; Paya-Vaya, Guillermo; Heymann, Henrik et al.
2017 IEEE 7th International Conference on Consumer Electronics - Berlin (ICCE-Berlin). IEEE Computer Society, 2017. S. 168-169.

Publikation: Beitrag in Buch/Bericht/Sammelwerk/KonferenzbandAufsatz in KonferenzbandForschungPeer-Review

Hartig, J, Paya-Vaya, G, Heymann, H & Blume, H 2017, Tool-supported design space exploration of a processor system for SIFT-feature detection. in 2017 IEEE 7th International Conference on Consumer Electronics - Berlin (ICCE-Berlin). IEEE Computer Society, S. 168-169, 7th IEEE International Conference on Consumer Electronics - Berlin, ICCE-Berlin 2017, Berlin, Deutschland, 3 Sept. 2017. https://doi.org/10.1109/ICCE-Berlin.2017.8210619
Hartig, J., Paya-Vaya, G., Heymann, H., & Blume, H. (2017). Tool-supported design space exploration of a processor system for SIFT-feature detection. In 2017 IEEE 7th International Conference on Consumer Electronics - Berlin (ICCE-Berlin) (S. 168-169). IEEE Computer Society. https://doi.org/10.1109/ICCE-Berlin.2017.8210619
Hartig J, Paya-Vaya G, Heymann H, Blume H. Tool-supported design space exploration of a processor system for SIFT-feature detection. in 2017 IEEE 7th International Conference on Consumer Electronics - Berlin (ICCE-Berlin). IEEE Computer Society. 2017. S. 168-169 doi: 10.1109/ICCE-Berlin.2017.8210619
Hartig, Julian ; Paya-Vaya, Guillermo ; Heymann, Henrik et al. / Tool-supported design space exploration of a processor system for SIFT-feature detection. 2017 IEEE 7th International Conference on Consumer Electronics - Berlin (ICCE-Berlin). IEEE Computer Society, 2017. S. 168-169
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title = "Tool-supported design space exploration of a processor system for SIFT-feature detection",
author = "Julian Hartig and Guillermo Paya-Vaya and Henrik Heymann and Holger Blume",
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AU - Hartig, Julian

AU - Paya-Vaya, Guillermo

AU - Heymann, Henrik

AU - Blume, Holger

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